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LMH6551MAX Datasheet(PDF) 7 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # LMH6551MAX
Description  Differential, High Speed Op Amp
Download  19 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LMH6551MAX Datasheet(HTML) 7 Page - National Semiconductor (TI)

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3.3V Electrical Characteristics (Note 2) (Continued)
Single ended in differential out, T
A= 25˚C, G = +1, VS = 3.3V, VCM = 1.65V, RF =RG = 365
Ω,R
L = 500
Ω; ; Unless specified-
Boldface limits apply at the temperature extremes.
Symbol
Parameter
Conditions
Min
(Note 8)
Typ
(Note 7)
Max
(Note 8)
Units
I
S
Supply Current
R
L =
8mA
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications, see the Electrical Characteristics tables.
Note 2: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of
the device such that TJ =TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA.
Note 3: The maximum output current (IOUT) is determined by device power dissipation limitations.
Note 4: The maximum power dissipation is a function of TJ(MAX), θJA and TA. The maximum allowable power dissipation at any ambient temperature is
P D=(TJ(MAX) —TA)/ θJA. All numbers apply for package soldered directly into a 2 layer PC board with zero air flow.
Note 5: Human body model: 1.5 k
Ω in series with 100 pF. Machine model: 0Ω in series with 200pF.
Note 6: Slew Rate is the average of the rising and falling edges.
Note 7: Typical numbers are the most likely parametric norm.
Note 8: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control
(SQC) methods.
Note 9: Negative input current implies current flowing out of the device.
Note 10: Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
Note 11: Parameter is guaranteed by design.
www.national.com
7


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