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TLV320AIC28RGZR Datasheet(PDF) 2 Page - Texas Instruments |
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TLV320AIC28RGZR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 81 page TLV320AIC28 SLAS418A − FEBRUARY 2004 − REVISED SEPTEMBER 2004 www.ti.com 2 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION PRODUCT PACKAGE PACKAGE DESIGNATOR OPERATING TEMPERATURE RANGE ORDERING NUMBER TRANSPORT MEDIA TLV320AIC28 QFN-48 RGZ −40 °C to +85°C TLV320AIC28IRGZ Rails, 52 TLV320AIC28 QFN-48 RGZ −40 °C to +85°C TLV320AIC28IRGZR Tape and Reel, 2500 PIN ASSIGNMENTS QFN PACKAGE (TOP VIEW) 13 DRVSS2 OUT8P BVDD OUT8N DRVSS1 VGND SPKFC DRVDD SPK2 SPK1 OUT32N MIC_DETECT_IN 36 35 34 33 32 31 30 29 28 27 26 25 1 2 3 4 5 6 7 8 9 10 11 12 IOVDD PWR_DN RESET GPIO2 GPIO1 AVDD2 AVSS2 AVDD1 NC NC NC NC 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 |
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