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LM34C Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. LM34C
Description  Precision Fahrenheit Temperature Sensors
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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Absolute Maximum Ratings (Note 10)
If MilitaryAerospace specified devices are required
please contact the National Semiconductor Sales
OfficeDistributors for availability and specifications
Supply Voltage
a
35V to b02V
Output Voltage
a
6V to b10V
Output Current
10 mA
Storage Temperature
TO-46 Package
b
76 Fto a356 F
TO-92 Package
b
76 Fto a300 F
SO-8 Package
b
65 Cto a150 C
ESD Susceptibility (Note 11)
800V
Lead Temp
TO-46 Package (Soldering 10 seconds)
a
300 C
TO-92 Package (Soldering 10 seconds)
a
260 C
SO Package (Note 12)
Vapor Phase (60 seconds)
215 C
Infrared (15 seconds)
220 C
Specified Operating Temp Range (Note 2)
TMIN to TMAX
LM34 LM34A
b
50 Fto a300 F
LM34C LM34CA
b
40 Fto a230 F
LM34D
a
32 Fto a212 F
DC Electrical Characteristics (Note 1 Note 6)
LM34A
LM34CA
Parameter
Conditions
Tested
Design
Tested
Design
Units
Typical
Limit
Limit
Typical
Limit
Limit
(Max)
(Note 4)
(Note 5)
(Note 4)
(Note 5)
Accuracy (Note 7)
TA ea77 F
g
04
g
10
g
04
g
10
F
TA e 0 F
g
06
g
06
g
20
F
TA e TMAX
g
08
g
20
g
08
g
20
F
TA e TMIN
g
08
g
20
g
08
g
30
F
Nonlinearity (Note 8)
TMIN s TA s TMAX
g
035
g
07
g
030
g
06
F
Sensor Gain
TMIN s TA s TMAX
a
100
a
99
a
100
a
99
mV F min
(Average Slope)
a
101
a
101
mV F max
Load Regulation
TA ea77 F
g
04
g
10
g
04
g
10
mVmA
(Note 3)
TMIN s TA s TMAX
g
05
g
30
g
05
g
30
mVmA
0 s IL s 1mA
Line Regulation (Note 3)
TA ea77 F
g
001
g
005
g
001
g
005
mVV
5V s VS s 30V
g
002
g
01
g
002
g
01
mVV
Quiescent Current
VS ea5V a77 F75
90
75
90
m
A
(Note 9)
VS ea5V
131
160
116
139
m
A
VS ea30V a77 F76
92
76
92
m
A
VS ea30V
132
163
117
142
m
A
Change of Quiescent
4V s VS s 30V a77 F
a
05
20
05
20
m
A
Current (Note 3)
5V s VS s 30V
a
10
30
10
30
m
A
Temperature Coefficient
a
030
a
05
a
030
a
05
m
A F
of Quiescent Current
Minimum Temperature
In circuit of
Figure 1
a
30
a
50
a
30
a
50
F
for Rated Accuracy
IL e 0
Long-Term Stability
Tj e TMAX for 1000 hours
g
016
g
016
F
Note 1
Unless otherwise noted these specifications apply b50 F s Tj s a 300 F for the LM34 and LM34A b40 F s Tj s a230 F for the LM34C and
LM34CA and a32 F s Tj s a 212 F for the LM34D VS ea5 Vdc and ILOAD e 50 mA in the circuit of Figure 2 a6 Vdc for LM34 and LM34A for 230 F s Tj s
300 F These specifications also apply from a5 FtoTMAX in the circuit of Figure 1
Note 2
Thermal resistance of the TO-46 package is 720 FW junction to ambient and 43 FW junction to case Thermal resistance of the TO-92 package is
324 FW junction to ambient Thermal resistance of the small outline molded package is 400 FW junction to ambient For additional thermal resistance informa-
tion see table in the Typical Applications section
Note 3
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance
Note 4
Tested limits are guaranteed and 100% tested in production
Note 5
Design limits are guaranteed (but not 100% production tested) over the indicated temperature and supply voltage ranges These limits are not used to
calculate outgoing quality levels
Note 6
Specification in BOLDFACE TYPE apply over the full rated temperature range
Note 7
Accuracy is defined as the error between the output voltage and 10 mV F times the device’s case temperature at specified conditions of voltage current
and temperature (expressed in F)
Note 8
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range
Note 9
Quiescent current is defined in the circuit of
Figure 1
Note 10
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when
operating the device beyond its rated operating conditions (see Note 1)
Note 11
Human body model 100 pF discharged through a 15 kX resistor
Note 12
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
2




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