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SN74LVC1G34YZPR Datasheet(PDF) 1 Page - Texas Instruments |
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SN74LVC1G34YZPR Datasheet(HTML) 1 Page - Texas Instruments |
1 / 14 page www.ti.com FEATURES 3 2 4 5 1 NC VCC Y A GND DBV PACKAGE (TOP VIEW) YEA, YEP, YZA, OR YZP PACKAGE (BOTTOM VIEW) DCK PACKAGE (TOP VIEW) 3 2 4 5 1 NC VCC Y A GND 3 2 4 5 1 NC Y A GND DNU GND VCC Y A DRL PACKAGE (TOP VIEW) See mechanical drawings for dimensions. 1 4 2 3 5 VCC DNU − Do not use YZV PACKAGE (BOTTOM VIEW) GND VCC Y A 3 1 2 4 DESCRIPTION/ORDERING INFORMATION SN74LVC1G34 SINGLE BUFFER GATE SCES519F – DECEMBER 2003 – REVISED OCTOBER 2005 • Available in the Texas Instruments • Ioff Supports Partial-Power-Down Mode NanoStar™ and NanoFree™ Packages Operation • Supports 5-V V CC Operation • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • Inputs Accept Voltages to 5.5 V • ESD Protection Exceeds JESD 22 • Max t pd of 3.5 ns at 3.3 V – 2000-V Human-Body Model (A114-A) • Low Power Consumption, 1- µA Max I CC – 200-V Machine Model (A115-A) • ±24-mA Output Drive at 3.3 V – 1000-V Charged-Device Model (C101) This single buffer gate is designed for 1.65-V to 5.5-V VCC operation. The SN74LVC1G34 performs the Boolean function Y = A in positive logic. NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package. This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. NanoStar, NanoFree are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 2003–2005, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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