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DS_K6F1016U4C Datasheet(PDF) 8 Page - Samsung semiconductor |
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DS_K6F1016U4C Datasheet(HTML) 8 Page - Samsung semiconductor |
8 / 9 page Revision 2.0 CMOS SRAM September 2003 K6F1016U4C Family - 8 - Address CS Data Valid UB, LB WE Data in Data out High-Z High-Z TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled) NOTES (WRITE CYCLE) 1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi- tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write. 2. tCW is measured from the CS going low to the end of write. 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. tWR applied in case a write ends as CS or WE going high. tWC tCW(2) tBW tWP(1) tDH tDW tWR(4) tAW DATA RETENTION WAVE FORM VCC 2.7V 2.2V VDR CS, LB/UB GND tAS(3) Data Retention Mode CS ≥VCC - 0.2V or LB=UB≥Vcc-0.2V tSDR tRDR |
Similar Part No. - DS_K6F1016U4C |
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Similar Description - DS_K6F1016U4C |
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