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CY74FCT373T Datasheet(PDF) 4 Page - Texas Instruments

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Part No. CY74FCT373T
Description  8-BIT LATCHES WITH 3-STATE OUTPUTS
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Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
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CY74FCT373T Datasheet(HTML) 4 Page - Texas Instruments

   
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CY54FCT373T, CY74FCT373T
8-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS021B – MAY 1994 – REVISED OCTOBER 2001
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
CY54FCT373T
CY74FCT373T
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP†
MAX
MIN
TYP†
MAX
UNIT
VIK
VCC = 4.5 V,
IIN = –18 mA
–0.7
–1.2
V
VIK
VCC = 4.75 V,
IIN = –18 mA
–0.7
–1.2
V
VCC = 4.5 V,
IOH = –12 mA
2.4
3.3
VOH
VCC 475 V
IOH = –32 mA
2
V
VCC = 4.75 V
IOH = –15 mA
2.4
3.3
VOL
VCC = 4.5 V,
IOL = 32 mA
0.3
0.55
V
VOL
VCC = 4.75 V,
IOL = 64 mA
0.3
0.55
V
Vhys
All inputs
0.2
0.2
V
II
VCC = 5.5 V,
VIN = VCC
5
µA
II
VCC = 5.25 V,
VIN = VCC
5
µA
IIH
VCC = 5.5 V,
VIN = 2.7 V
±1
µA
IIH
VCC = 5.25 V,
VIN = 2.7 V
±1
µA
IIL
VCC = 5.5 V,
VIN = 0.5 V
±1
µA
IIL
VCC = 5.25 V,
VIN = 0.5 V
±1
µA
IOZH
VCC = 5.5 V,
VOUT = 2.7 V
10
µA
IOZH
VCC = 5.25 V,
VOUT = 2.7 V
10
µA
IOZL
VCC = 5.5 V,
VOUT = 0.5 V
–10
µA
IOZL
VCC = 5.25 V,
VOUT = 0.5 V
–10
µA
IOS‡
VCC = 5.5 V,
VOUT = 0 V
–60
–120
–225
mA
IOS‡
VCC = 5.25 V,
VOUT = 0 V
–60
–120
–225
mA
Ioff
VCC = 0 V,
VOUT = 4.5 V
±1
±1
µA
ICC
VCC = 5.5 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
ICC
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
∆ICC
VCC = 5.5 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.5
2
mA
∆ICC
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.5
2
mA
† Typical values are at VCC = 5 V, TA = 25°C.
‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or
sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence
of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND


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