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TSC87251G2D Datasheet(PDF) 9 Page - TEMIC Semiconductors |
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TSC87251G2D Datasheet(HTML) 9 Page - TEMIC Semiconductors |
9 / 28 page Qualpack TSC87251G2D Rev. 0 – October 1999 9 2.6 Wafer Process Control All the inspections and controls are defined as a process step in the production management software, and are led by using a centralized SPC software. PC system could be summarized as follows: Probe die-sort Assembly - NANTES: hermetic packages - Subcontractors : plastic packages Final Test Process parameters Electrical Test Engineering Database Physical SPC (xbar / R) Cpk tracking Electrical SPC (xbar / s) Cpk tracking Attribute Physical measurement SPC (xbar / R) Cpk tracking Attribute Measurement - NANTES : hermetic packages - Subcontractors : plastic packages Wafer Fab Critical process parameters are identified by using F.M.E.A. and other advanced tools. Those parameters are followed in real time with the SPC methodology and their capability is measured and monthly reported in the Operation Review. For end 1999, the Cpk target is the following: % of all parameters per Cpk categories 0% 20% 40% 60% 80% 100% 1995 1996 1997 1998 Obj. 99 >1.67 <1.67 |
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