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CASR-6-NP Datasheet(PDF) 11 Page - LEM |
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CASR-6-NP Datasheet(HTML) 11 Page - LEM |
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11 / 24 page  Fig. . CASR 50-NP - Frequency response 11 Standards The CAS / CASR / CKSR models have been designed and tested according to latest recognized worldwide standards for industrial applications: The EN 50178 standard dedicated to “Electronic Equipment for use in power installations” in industrial applications is our standard of reference for electrical, environmental and mechanical parameters. It guarantees the overall performances of our products in industrial environments. CAS / CASR / CKSR products are CE marked as a guarantee of the products compliance to the European EMC directive 8/336/EEC and low voltage directive. They also comply with the derived local EMC regulations (EMC: Electro-Magnetic Compatibility). Insulation and safety The EN 50178 and IEC 61010-1 standards (“Safety requirements for electrical equipment for measurement, control, and laboratory use”) are used as references to design the creepage and clearance distances versus the needed insulation levels (rated insulation voltage) and the conditions of use (as previously seen page 7). The rated insulation voltage level for transducers in “industrial” applications, is defined according to several criteria listed under the both standards EN 50178 and IEC 61010-1. Some criteria are dependent on the transducer itself when the others are linked to the application. The products comply with UL 508C for UR marking. Reliability and Quality Of course, reliability and lifetime are guaranteed by the quality in design and process. Accelerated tests have been performed to estimate failure rate (temperature cycle and/or humidity test and complete characterization of the product according to standards). Beside, the CAS / CASR / CKSR models have been designed to pass the + 85°C + 85 % relative humidity test during 1000 hours (transducers power supplied during the test). The CAS / CASR / CKSR models are manufactured in one of the LEM production center that is ISO/TS 164, ISO 14001, ISO 001:2000 and IRIS certified and where quality tools such as DPT FMEA, Control Plan, Cpk, R&R, QOS-8D, IPQ, ect are used in addition to the Six Sigma methodology. Common mode behaviour Common mode noises (dv/dt) are often encountered in applications using fast switching components like IGBTs. It is not surprising to encounter switching frequencies up to and even higher than 20 kHz for highly efficient inverters. The result of a dv/dt between the primary conductor and the electronic circuit of a current transducer is a capacitive current perturbating the various electronic components that are sensitive to that. Any electrical component with a galvanic isolation between the primary and the secondary circuit has a capacitive coupling between the isolated potentials. This capacitive current results in an additional error on the transducer output during a short time. The error caused by these dv/dt has to be as low as possible in order to avoid any unwanted activation of a possible protection circuit, which could lead to a shut down of the application. This additional noise caused by the dv/dt can be filtered, but the best way is to have it at the lowest possible value and during the shortest time avoiding then any additional filter to be installed. For example, a voltage change of 10 kV/µs in combination with a 10 pF coupling capacity generates a parasitic output current of 100 mA. For the CAS 25-NP for example, this would represent seven times the nominal current. Fig. 10a shows the behaviour at a voltage change of 20 kV/µs and an applied voltage of + 600 V (total voltage variation of 1200 V from –600 V to + 600 V) with a CASR 50-NP. Due to CAS–CASR–CKSR low parasitic capacitance, the effect of dynamic common mode is reduced. We can notice an interference of about 74 % of I PN during the dv / dt when measurement V OUT is referenced to 0 V. Note the very short duration of the disturbance of less than 250 ns, which can be easily filtered. When V OUT is referenced to V REF to do the output measurement, then the disturbance during dv/dt seen on the output is equal to the difference between the disturbance on V OUT and the disturbance on V REF (Fig. 10b). In these conditions, we can notice on the output signal (V OUT - VREF) an interference of about 55 % of I PN during the dv/dt and 24 % of IPN after the dv/dt, the signal coming back to its normal state only 350 ns after the end of the dv/dt. |
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