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IS24C32-2 Datasheet(PDF) 9 Page - Integrated Silicon Solution, Inc |
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IS24C32-2 Datasheet(HTML) 9 Page - Integrated Silicon Solution, Inc |
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9 / 11 page  Integrated Silicon Solution, Inc. — 1-800-379-4774 9 PRELIMINARY INFORMATION Rev. 00B 04/04/01 IS24C32-2/3 IS24C64-2/3 ISSI® DC ELECTRICAL CHARACTERISTICS Symbol Parameter Test Conditions Min. Max. Unit VOL1 Output LOW Voltage VCC = 1.8V, IOL = 0.15 mA — 0.2 V VOL2 Output LOW Voltage VCC = 2.5V, IOL = 1.0 mA — 0.4 V VIH Input HIGH Voltage VCC X 0.7 VCC + 0.5 V VIL Input LOW Voltage –1.0 VCC X 0.3 V ILI Input Leakage Current VIN = VCC max. — 3µA ILO Output Leakage Current — 3µA Notes: VIL min and VIH max are reference only and are not tested. POWER SUPPLY CHARACTERISTICS Symbol Parameter Test Conditions Min. Max. Unit ICC1 Vcc Operating Current READ at 100 KHz (Vcc = 5V) — 1.0 mA ICC2 Vcc Operating Current WRITE at 100 KHz (Vcc = 5V) — 3.0 mA ISB1 Standby Current Vcc = 1.8V — 5µA ISB2 Standby Current Vcc = 5.5V — 10 µA AC ELECTRICAL CHARACTERISTICS 1.8V-5.5V 2.5V-5.5V Symbol Parameter Test Conditions Min. Max. Min. Max. Unit fSCL SCL Clock Frequency 0 100 0 400 KHz T Noise Suppression Time(1) — 100 — 50 ns tLOW Clock LOW Period 4.7 — 1.2 — µs tHIGH Clock HIGH Period 4 — 0.6 — µs tBUF Bus Free Time Before New Transmission(1) 4.7 — 1.2 — µs tSU:STA Start Condition Setup Time 4.7 — 0.6 — µs tSU:STO Stop Condition Setup Time 4.7 — 0.6 — µs tHD:STA Start Condition Hold Time 4 — 0.6 — µs tHD:STO Stop Condition Hold Time 4 — 0.6 — µs tSU:DAT Data In Setup Time 200 — 100 — ns tHD:DAT Data In Hold Time 0 — 0 — ns tDH Data Out Hold Time SCL LOW to SDA Data Out Change 100 — 50 — ns tAA Clock to Output SCL LOW to SDA Data Out Valid 0.1 4.5 0.1 0.9 µs tR SCL and SDA Rise Time(1) — 1000 — 300 ns tF SCL and SDA Fall Time(1) — 300 — 300 ns tWR Write Cycle Time — 10 — 5ms Note: 1. This parameter is characterized but not 100% tested. |
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