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CY29FCT818CTQCT Datasheet(PDF) 1 Page - Texas Instruments |
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CY29FCT818CTQCT Datasheet(HTML) 1 Page - Texas Instruments |
1 / 14 page CY29FCT818T DIAGNOSTIC SCAN REGISTER WITH 3-STATE OUTPUTS SCCS012B – MAY 1994 – REVISED NOVEMBER 2001 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Function, Pinout, and Drive Compatible With FCT, F Logic, and AM29818 D Reduced VOH (Typically = 3.3 V) Version of Equivalent FCT Functions D Edge-Rate Control Circuitry for Significantly Improved Noise Characteristics D Ioff Supports Partial-Power-Down Mode Operation D Matched Rise and Fall Times D Fully Compatible With TTL Input and Output Logic Levels D 8-Bit Pipeline and Shadow Register D ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) D CY29FCT818CT – 64-mA Output Sink Current – 32-mA Output Source Current D CY29FCT818ATDMB – 20-mA Output Sink Current – 3-mA Output Source Current D 3-State Outputs description The CY29FCT818T contains a high-speed 8-bit general-purpose data pipeline register and a high-speed 8-bit shadow register. The general-purpose register can be used in an 8-bit-wide data path for a normal system application. The shadow register is designed for applications such as diagnostics in sequential circuits, where it is desirable to load known data at a specific location in the circuit and to read the data at that location. The shadow register can load data from the output of the device, and can be used as a right-shift register with bit-serial input (SDI) and output (SDO), using DCLK. The data register input is multiplexed to enable loading from the shadow register or from the data input pins, using PCLK. Data can be loaded simultaneously from the shadow register to the pipeline register, and from the pipeline register to the shadow register, provided setup-time and hold-time requirements are satisfied, with respect to the two independent clock inputs. In a typical application, the general-purpose register in this device replaces an 8-bit data register in the normal data path of a system. The shadow register is placed in an auxiliary bit-serial loop that is used for diagnostics. During diagnostic operation, data is shifted serially into the shadow register, then transferred to the general-purpose register to load a known value into the data path. To read the contents at that point in the data path, the data is transferred from the data register into the shadow register, then shifted serially in the auxiliary diagnostic loop to make it accessible to the diagnostics controller. This data then is compared with the expected value to diagnose faulty operation of the sequential circuit. This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. Copyright 2001, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. D, P, Q, OR SO PACKAGE (TOP VIEW) 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 OE DCLK D0 D1 D2 D3 D4 D5 D6 D7 SDI GND VCC MODE Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 SDO PCLK On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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