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PI3C3245Q Datasheet(PDF) 2 Page - Pericom Semiconductor Corporation |
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PI3C3245Q Datasheet(HTML) 2 Page - Pericom Semiconductor Corporation |
2 / 4 page 2 PS8162B 12/10/99 12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012123456789012 12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012123456789012 12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012123456789012 12345678901234567890123456789012123456789012345678901234567890121234567890123456789012345678901212345678901234567890123456789012123456789012 PI3C3245 2.5V/3.3V,HighBandwidth, Hot Insertion, 8-Bit, 2-Port, Bus Switch Storage Temperature ........................................................65°C to +150°C Ambient Temperature with Power Applied ......................... 40°Cto+85°C Supply Voltage to Ground Potential (Inputs & VCC Only) ........0.5Vto+4.6V Supply Voltage to Ground Potential (Outputs & D/O Only) ......0.5Vto+4.6V DC Input Voltage .................................................................. 0.5Vto+5.5V DC Output Current ............................................................................ 120mA Power Dissipation ................................................................................ 0.5W Note: Stresses greater than those listed under MAXIMUM RATINGS may cause permanent damage to the de- vice. This is a stress rating only and functional opera- tion of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Maximum Ratings (Above which the useful life may be impaired. For user guidelines, not tested.) DC Electrical Characteristics (Over Operating Range, TA = –40°C to +85°C, VCC = 3.3V ±10%) Parameters Description Test Conditions(1) Min. Typ.(2) Max. Units VIH Input HIGH Voltage Guaranteed Logic HIGH Level 2.0 VIL Input LOW Voltage Guaranteed Logic LOW Level –0.5 0.8 IIH Input HIGH Current VCC = Max., VIN = VCC ±1 IIL Input LOW Current VCC = Max., VIN = GND ±1 µA IOZH High Impedance Output Current 0 ≤ A, B ≤ VCC ±1 VIK Clamp Diode Voltage VCC = Min., IIN = –18mA –0.73 –1.2 V RON Switch On Resistance (4) VCC = Min., VIN = 0.0V, ION = 48mA 5 7 Ω VCC = Min., VIN = 2.4V, ION = 15mA 8 15 Parameters(5) Description Test Conditions Typ. Units CIN Input Capacitance VIN = 0V 3.5 COFF A/B Capacitance, Switch Off VIN = 0V 5.0 pF CON A/B Capacitance, Switch On VIN = 0V 10.0 Notes: 1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC =3.3V,TA = 25°C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. Measured by the voltage drop between A and B pin at indicated current through the switch. ON resistance is determined by the lower of the voltages on the two (A,B) pins. 5. This parameter is determined by device characterization but is not production tested. V Capacitance (TA = 25°C, f = 1 MHz) |
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