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LTC1403ACMSE Datasheet(PDF) 4 Page - Linear Technology |
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LTC1403ACMSE Datasheet(HTML) 4 Page - Linear Technology |
4 / 20 page 4 LTC1403/LTC1403A 1403af SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS fSAMPLE(MAX) Maximum Sampling Frequency per Channel q 2.8 MHz (Conversion Rate) tTHROUGHPUT Minimum Sampling Period (Conversion + Acquisiton Period) q 357 ns tSCK Clock Period (Note 16) q 19.8 10000 ns tCONV Conversion Time (Note 6) 16 18 SCLK cycles t1 Minimum Positive or Negative SCLK Pulse Width (Note 6) 2 ns t2 CONV to SCK Setup Time (Notes 6, 10) 3 ns t3 Nearest SCK Edge Before CONV (Note 6) 0 ns t4 Minimum Positive or Negative CONV Pulse Width (Note 6) 4 ns t5 SCK to Sample Mode (Note 6) 4 ns t6 CONV to Hold Mode (Notes 6, 11) 1.2 ns t7 16th SCK ↑ to CONV↑ Interval (Affects Acquisition Period) (Notes 6, 7, 13) 45 ns t8 Minimum Delay from SCK to Valid Bits 0 Through 13 (Notes 6, 12) 8 ns t9 SCK to Hi-Z at SDO (Notes 6, 12) 6 ns t10 Previous SDO Bit Remains Valid After SCK (Notes 6, 12) 2 ns t12 VREF Settling Time After Sleep-to-Wake Transition (Notes 6, 14) 2 ms TI I G CHARACTERISTICS The q denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. VDD = 3V POWER REQUIRE E TS The q denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 17) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS VDD Supply Voltage 2.7 3.6 V IDD Positive Supply Voltage Active Mode q 4.7 7 mA Nap Mode q 1.1 1.5 mA Sleep Mode (LTC1403) 2 15 µA Sleep Mode (LTC1403A) 2 10 µA PD Power Dissipation Active Mode with SCK in Fixed State (Hi or Lo) 12 mW Note 1: Absolute Maximum Ratings are those values beyond which the life of a device may be impaired. Note 2: All voltage values are with respect to GND. Note 3: When these pins are taken below GND or above VDD, they will be clamped by internal diodes. This product can handle input currents greater than 100mA below GND or greater than VDD without latchup. Note 4: Offset and full-scale specifications are measured for a single- ended AIN + input with AIN– grounded and using the internal 2.5V reference. Note 5: Integral linearity is tested with an external 2.55V reference and is defined as the deviation of a code from the straight line passing through the actual endpoints of a transfer curve. The deviation is measured from the center of quantization band. Note 6: Guaranteed by design, not subject to test. Note 7: Recommended operating conditions. Note 8: The analog input range is defined for the voltage difference between AIN + and AIN–. Note 9: The absolute voltage at AIN+ and AIN– must be within this range. Note 10: If less than 3ns is allowed, the output data will appear one clock cycle later. It is best for CONV to rise half a clock before SCK, when running the clock at rated speed. Note 11: Not the same as aperture delay. Aperture delay is smaller (1ns) because the 2.2ns delay through the sample-and-hold is subtracted from the CONV to Hold mode delay. Note 12: The rising edge of SCK is guaranteed to catch the data coming out into a storage latch. Note 13: The time period for acquiring the input signal is started by the 16th rising clock and it is ended by the rising edge of convert. Note 14: The internal reference settles in 2ms after it wakes up from Sleep mode with one or more cycles at SCK and a 10 µF capacitive load. Note 15: The full power bandwidth is the frequency where the output code swing drops to 3dB with a 2.5VP-P input sine wave. Note 16: Maximum clock period guarantees analog performance during conversion. Output data can be read without an arbitrarily long clock. Note 17: VDD = 3V, fSAMPLE = 2.8Msps. Note 18: The LTC1403A is measured and specified with 14-bit Resolution (1LSB = 152 µV) and the LTC1403 is measured and specified with 12-bit Resolution (1LSB = 610 µV). |
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