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LTC1403ACMSE Datasheet(PDF) 4 Page - Linear Technology

Part # LTC1403ACMSE
Description  Serial 12-Bit/14-Bit, 2.8Msps Sampling ADCs with Shutdown
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Manufacturer  LINER [Linear Technology]
Direct Link  http://www.linear.com
Logo LINER - Linear Technology

LTC1403ACMSE Datasheet(HTML) 4 Page - Linear Technology

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LTC1403/LTC1403A
1403af
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
fSAMPLE(MAX)
Maximum Sampling Frequency per Channel
q
2.8
MHz
(Conversion Rate)
tTHROUGHPUT
Minimum Sampling Period (Conversion + Acquisiton Period)
q
357
ns
tSCK
Clock Period
(Note 16)
q
19.8
10000
ns
tCONV
Conversion Time
(Note 6)
16
18
SCLK cycles
t1
Minimum Positive or Negative SCLK Pulse Width
(Note 6)
2
ns
t2
CONV to SCK Setup Time
(Notes 6, 10)
3
ns
t3
Nearest SCK Edge Before CONV
(Note 6)
0
ns
t4
Minimum Positive or Negative CONV Pulse Width
(Note 6)
4
ns
t5
SCK to Sample Mode
(Note 6)
4
ns
t6
CONV to Hold Mode
(Notes 6, 11)
1.2
ns
t7
16th SCK
↑ to CONV↑ Interval (Affects Acquisition Period)
(Notes 6, 7, 13)
45
ns
t8
Minimum Delay from SCK to Valid Bits 0 Through 13
(Notes 6, 12)
8
ns
t9
SCK to Hi-Z at SDO
(Notes 6, 12)
6
ns
t10
Previous SDO Bit Remains Valid After SCK
(Notes 6, 12)
2
ns
t12
VREF Settling Time After Sleep-to-Wake Transition
(Notes 6, 14)
2
ms
TI I G CHARACTERISTICS The q denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. VDD = 3V
POWER REQUIRE E TS The q denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. (Note 17)
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
VDD
Supply Voltage
2.7
3.6
V
IDD
Positive Supply Voltage
Active Mode
q
4.7
7
mA
Nap Mode
q
1.1
1.5
mA
Sleep Mode (LTC1403)
2
15
µA
Sleep Mode (LTC1403A)
2
10
µA
PD
Power Dissipation
Active Mode with SCK in Fixed State (Hi or Lo)
12
mW
Note 1: Absolute Maximum Ratings are those values beyond which the life
of a device may be impaired.
Note 2: All voltage values are with respect to GND.
Note 3: When these pins are taken below GND or above VDD, they will be
clamped by internal diodes. This product can handle input currents greater
than 100mA below GND or greater than VDD without latchup.
Note 4: Offset and full-scale specifications are measured for a single-
ended AIN
+ input with AIN– grounded and using the internal 2.5V reference.
Note 5: Integral linearity is tested with an external 2.55V reference and is
defined as the deviation of a code from the straight line passing through
the actual endpoints of a transfer curve. The deviation is measured from
the center of quantization band.
Note 6: Guaranteed by design, not subject to test.
Note 7: Recommended operating conditions.
Note 8: The analog input range is defined for the voltage difference
between AIN
+ and AIN–.
Note 9: The absolute voltage at AIN+ and AIN– must be within this range.
Note 10: If less than 3ns is allowed, the output data will appear one clock
cycle later. It is best for CONV to rise half a clock before SCK, when
running the clock at rated speed.
Note 11: Not the same as aperture delay. Aperture delay is smaller (1ns)
because the 2.2ns delay through the sample-and-hold is subtracted from
the CONV to Hold mode delay.
Note 12: The rising edge of SCK is guaranteed to catch the data coming
out into a storage latch.
Note 13: The time period for acquiring the input signal is started by the
16th rising clock and it is ended by the rising edge of convert.
Note 14: The internal reference settles in 2ms after it wakes up from Sleep
mode with one or more cycles at SCK and a 10
µF capacitive load.
Note 15: The full power bandwidth is the frequency where the output code
swing drops to 3dB with a 2.5VP-P input sine wave.
Note 16: Maximum clock period guarantees analog performance during
conversion. Output data can be read without an arbitrarily long clock.
Note 17: VDD = 3V, fSAMPLE = 2.8Msps.
Note 18: The LTC1403A is measured and specified with 14-bit Resolution
(1LSB = 152
µV) and the LTC1403 is measured and specified with 12-bit
Resolution (1LSB = 610
µV).


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