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DS1258Y-70 Datasheet(PDF) 6 Page - Dallas Semiconductor

Part # DS1258Y-70
Description  128k x 16 Nonvolatile SRAM
Download  8 Pages
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Manufacturer  DALLAS [Dallas Semiconductor]
Direct Link  https://www.maximintegrated.com/en.html
Logo DALLAS - Dallas Semiconductor

DS1258Y-70 Datasheet(HTML) 6 Page - Dallas Semiconductor

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DS1258Y/AB
6 of 8
POWER-DOWN/POWER-UP CONDITION
POWER-DOWN/POWER-UP TIMING
(tA: See Note 10)
PARAMETER
SYMBOL
MIN
TYP
MAX
UNITS NOTES
CEU
, CEL at VIH before Power-Down
tPD
0
ms
11
VCC slew from VTP to 0V
tF
300
ms
VCC slew from 0V to VTP
tR
300
ms
CEU
, CEL at VIH after Power-Up
tREC
2
125
ms
(tA =+25
°C)
PARAMETER
SYMBOL
MIN
TYP
MAX
UNITS NOTES
Expected Data Retention Time
tDR
10
years
9
WARNING:
Under no circumstance are negative undershoots, of any amplitude, allowed when device is in battery
backup mode.
NOTES:
1) WE is high for a Read Cycle.
2) OE = VIH or VIL. If OE = VIH during write cycle, the output buffers remain in a high impedance state.
3) tWP is specified as the logical AND of CEU or CEL and WE . tWP is measured from the latter of CEU ,
CEL
or WE going low to the earlier of CEU , CEL or WE going high.
4) tDS is measured from the earlier of CEU or CEL or WE going high.
5) These parameters are sampled with a 5pF load and are not 100% tested.
6) If the CEU or CEL low transition occurs simultaneously with or later than the WE low transition in
the output buffers remain in a high impedance state during this period.
7) If the CEU or CEL high transition occurs prior to or simultaneously with the WE high transition, the
output buffers remain in high impedance state during this period.


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