STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-94680

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

E

SHEET

11

DSCC FORM 2234

APR 97

TABLE IIA. Electrical test requirements.

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(in accordance with

MIL-PRF-38535, table III)

Device

class M

Device

class Q

Device

class V

Interim electrical

parameters (see 4.2)

1

1

1

Final electrical

parameters (see 4.2)

1,2,3,4 1/

1,2,3,4 1/

1,2,3,4 1/ 2/

Group A test

requirements (see 4.4)

1,2,3,4

1,2,3,4

1,2,3,4

Group C end-point electrical

parameters (see 4.4)

1

1

1 2/

Group D end-point electrical

parameters (see 4.4)

1

1

1

Group E end-point electrical

parameters (see 4.4)

---

---

1,4

1/ PDA applies to subgroup 1.

2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits

shall be completed with reference to the zero hour electrical parameters (see table I).

Parameter

Device type

Limit

Delta

Min

Max

02, 03

-135

+135

75 V

02, 03

-70

+70

10 nA

1/ Deltas are performed at room temperature.

2/ 240 hour burn-in and 1,000 hour operating group C life test.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a.

Tests shall be as specified in table IIA herein.

b.

Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.