CM1293A_12 datasheet(1/9 Pages) ONSEMI

Part #	CM1293A

Description	Low Capacitance ESD Protection Arrays

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Manufacturer	ONSEMI [ON Semiconductor]

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July, 2012 − Rev. 8

1

Publication Order Number:

CM1293A/D

CM1293A

2 and 4-Channel

Low Capacitance

ESD Protection Arrays

Product Description

The CM1293A family of diode arrays has been designed to provide

ESD protection for electronic components or subsystems requiring

minimal capacitive loading. These devices are ideal for protecting

systems with high data and clock rates or for circuits requiring low

capacitive loading. Each ESD channel consists of a pair of diodes in

series that steer the positive or negative ESD current pulse to either the

positive (VP) or negative (VN) supply rail. A Zener diode is embedded

between VP and VN which helps protect the VCC rail against ESD

strikes. The CM1293A protects against ESD pulses up to

±8kV

contact discharge) per the IEC 61000−4−2 Level 4 standard.

This device is particularly well−suited for protecting systems using

high−speed ports such as USB2.0, IEEE1394 (FireWire®, i.LINK

t),

Serial ATA, DVI, HDMI, and corresponding ports in removable

storage, digital camcorders, DVD−RW drives and other applications

where extremely low loading capacitance with ESD protection are

required in a small package footprint.

Features

• Two and Four Channels of ESD Protection

• Provides ESD Protection to IEC61000−4−2

♦

±8 kV Contact Discharge

• Low Loading Capacitance of 2.0 pF Max

• Low Clamping Voltage

• Channel I/O to I/O Capacitance 1.5 pF Typical

• Zener Diode Protects Supply Rail and Eliminates the Need for

External By−Pass Capacitors

• Each I/O Pin Can Withstand over 1000 ESD Strikes*

• These Devices are Pb−Free and are RoHS Compliant

Applications

• DVI Ports, HDMI Ports in Notebooks, Set Top Boxes, Digital TVs,

LCD Displays

• Serial ATA Ports in Desktop PCs and Hard Disk Drives

• PCI Express Ports

• General Purpose High−Speed Data Line ESD Protection

*Standard test condition is IEC61000−4−2 level 4 test circuit with each pin

subjected to ±8 kV contact discharge for 1000 pulses. Discharges are timed at

1 second intervals and all 1000 strikes are completed in one continuous test run.

The part is then subjected to standard production test to verify that all of the

tested parameters are within spec after the 1000 strikes.

CH4

VP

VN

CH3

CH1

CH2

CM1293A−04MR

VP

VN

CH1

CM1293A−02SR

CM1293A−02SO

CH2

MSOP−10

(Pb−Free)

SC−74

(Pb−Free)

MARKING DIAGRAM

Device

Package

Shipping†

ORDERING INFORMATION

http://onsemi.com

SOT143−4

(Pb−Free)

3,000 /

Tape & Reel

CM1293A−02SR

3,000 /

Tape & Reel

CM1293A−02SO

4,000 /

Tape & Reel

CM1293A−04MR

†For information on tape and reel specifications,

including part orientation and tape sizes, please

refer to our Tape and Reel Packaging Specification

Brochure, BRD8011/D.

XXX MG

G

MSOP−10

MR SUFFIX

CASE 846AE

BLOCK DIAGRAM

XXX MG

G

XXX

= Specific Device Code

M

= Date Code

G

= Pb−Free Package

(*Note: Microdot may be in either loca-

tion)

SC−74

SO SUFFIX

CASE 318F

SOT−143

SR SUFFIX

CASE 318A

Similar Part No. - CM1293A_12

Manufacturer	Part #	Datasheet	Description
ON Semiconductor	CM1293A-02SO	397Kb / 16P	2-and 4-Channel Low Capacitance ESD Protection Arrays April 2010 ??Rev. 4
	CM1293A-02SR	397Kb / 16P	2-and 4-Channel Low Capacitance ESD Protection Arrays April 2010 ??Rev. 4
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	CM1293A-04SO	397Kb / 16P	2-and 4-Channel Low Capacitance ESD Protection Arrays April 2010 ??Rev. 4
	CM1293A-04SO	706Kb / 6P	4-Channel Low Capacitance ESD Protection Array January, 2012 ??Rev. 0

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