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LM45B Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. LM45B
Description  SOT-23 Precision Centigrade Temperature Sensors
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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 2 page
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Absolute Maximum Ratings (Note 1)
Supply Voltage
a
12V to b02V
Output Voltage
a
VS a 06V to b10V
Output Current
10 mA
Storage Temperature
b
65 Cto a150 C
Lead Temperature
SOT Package (Note 2)
Vapor Phase (60 seconds)
215 C
Infrared (15 seconds)
220 C
ESD Susceptibility (Note 3)
Human Body Model
2000V
Machine Model
TBD
Operating Ratings (Note 1)
Specified Temperature Range
(Note 4)
TMIN to TMAX
LM45B LM45C
b
20 Cto a100 C
Operating Temperature Range
LM45B LM45C
b
40 Cto a125 C
Supply Voltage Range (aVS)
a
40V to a10V
Electrical Characteristics Unless otherwise noted these specifications apply for aVS ea5Vdc and ILOAD e
a
50 mA in the circuit of
Figure 2 These specifications also apply from a25 CtoTMAX in the circuit of Figure 1 for aVS e
a
5Vdc Boldface limits apply for TA e TJ e TMIN to TMAX all other limits TA e TJ ea25 C unless otherwise noted
Parameter
Conditions
LM45B
LM45C
(Limit)
Units
Typical
Limit
Typical
Limit
(Note 5)
(Note 5)
Accuracy
TAea25 C
g
20
g
30
C (max)
(Note 6)
TAeTMAX
g
30
g
40
C (max)
TAeTMIN
g
30
g
40
C (max)
Nonlinearity
TMINsTAsTMAX
g
08
g
08
C (max)
(Note 7)
Sensor Gain
TMINsTAsTMAX
a
97
a
97
mV C (min)
(Average Slope)
a
103
a
103
mV C (max)
Load Regulation (Note 8)
0sILs a1mA
g
35
g
35
mVmA (max)
Line Regulation
a
40VsaVSsa10V
g
080
g
080
mVV (max)
(Note 8)
g
12
g
12
mVV (max)
Quiescent Current
a
40VsaVSsa10V a25 C
120
120
m
A (max)
(Note 9)
a
40VsaVSsa10V
160
160
m
A (max)
Change of Quiescent
40VsaVSs10V
20
20
m
A (max)
Current (Note 8)
Temperature Coefficient
a
20
a
20
m
A C
of Quiescent Current
Minimum Temperature
In circuit of
a
25
a
25
C (min)
for Rated Accuracy
Figure 1 ILe0
Long Term Stability (Note 10)
TJeTMAX for 1000 hours
g
012
g
012
C
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions
Note 2
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
Note 3
Human body model 100 pF discharged through a 15 kX resistor Machine model 200 pF discharged directly into each pin
Note 4
Thermal resistance of the SOT-23 package is 260 CW junction to ambient when attached to a printed circuit board with 2 oz foil as shown in
Figure 3
Note 5
Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 6
Accuracy is defined as the error between the output voltage and 10 mv C times the device’s case temperature at specified conditions of voltage current
and temperature (expressed in C)
Note 7
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range
Note 8
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance
Note 9
Quiescent current is measured using the circuit of
Figure 1
Note 10
For best long-term stability any precision circuit will give best results if the unit is aged at a warm temperature andor temperature cycled for at least 46
hours before long-term life test begins This is especially true when a small (Surface-Mount) part is wave-soldered allow time for stress relaxation to occur
2




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