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ACS780XLR Datasheet(PDF) 11 Page - Allegro MicroSystems |
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ACS780XLR Datasheet(HTML) 11 Page - Allegro MicroSystems |
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11 / 24 page  High-Precision Linear Hall-Effect-Based Current Sensor IC With 200 µΩ Current Conductor ACS780xLR 11 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com X150U PERFORMANCE CHARACTERISTICS1: TOP = –40°C to 125°C, VCC= 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. Max. Units Primary Sampled Current IP Transient 0 – 150 A Continuous 0 – 100 A Sensitivity2 SensTA Measured using 25% of full scale IP, TA = 25°C 25.8 26.66 27.53 mV/A Sens(TOP)HT Measured using 25% of full scale IP, TOP = 25°C to 125°C 25.79 26.66 27.53 mV/A Sens(TOP)LT Measured using 25% of full scale IP, TOP = –40°C to 25°C 25.66 26.66 27.66 mV/A Noise4 VNOISEPP Peak-to-peak, TA= 25°C, 1 nF on VOUT pin to GND – 24 – mV INOISE Input referred – 0.4 – mARMS / √(Hz) Nonlinearity ELIN Measured at VOUT around 3.5 V and 4.5 V –1 – 1 % Electrical Offset Voltage5,6 VOE(TA) IP = 0 A, TA = 25°C –10 ±3 10 mV VOE(TOP)HT IP = 0 A, TOP = 25°C to 125°C –10 ±5 10 mV VOE(TOP)LT IP = 0 A, TOP = –40°C to 25°C –20 ±10 20 mV Electric Offset Voltage Over Lifetime3 ΔVOE(LIFE) TOP = –40°C to 125°C, estimated shift after AEC-Q100 grade 0 qualification testing – ±1 – mV Total Output Error ETOT(HT) Measured using 25% of full scale IP, TOP = 25°C to 125°C –3.25 ±0.8 3.25 % ETOT(LT) Measured using 25% of full scale IP, TOP = –40°C to 25°C –3.75 ±1.5 3.75 % Total Output Error Including Lifetime Drift7 ETOT(HT,LIFE) Measured using 25% of full scale IP, TOP = 25°C to 125°C –4.1 ±2.28 4.1 % ETOT(LT,LIFE) Measured using 25% of full scale IP, TOP = –40°C to 25°C –5.6 ±2.98 5.6 % 1 See Characteristic Performance Data page for parameter distributions over temperature range. 2 This parameter may drift a maximum of ΔSensLIFE over lifetime. 3 Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 4 ±3 sigma noise voltage. 5 Drift is referred to ideal VOUT(QU) = 0.5 V. 6 This parameter may drift a maximum of ΔVOE(LIFE) over lifetime. 7 The maximum drift of any single device during qualification testing was 4%. |
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