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ACS780XLR Datasheet(PDF) 9 Page - Allegro MicroSystems

Part No. ACS780XLR
Description  Core-less, micro-sized, 100 A continuous current package
Download  24 Pages
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Maker  ALLEGRO [Allegro MicroSystems]
Homepage  http://www.allegromicro.com
Logo ALLEGRO - Allegro MicroSystems

ACS780XLR Datasheet(HTML) 9 Page - Allegro MicroSystems

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High-Precision Linear Hall-Effect-Based
Current Sensor IC With 200 ? Current Conductor
ACS780xLR
9
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
X100U PERFORMANCE CHARACTERISTICS1: TOP = ?40C to 150C, VCC= 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Units
Primary Sampled Current
IP
0
?
100
A
Sensitivity2
SensTA
Measured using 33% of full scale IP, TA = 25C
38.7
40
41.3
mV/A
Sens(TOP)HT Measured using 33% of full scale IP, TOP = 25C to 150C
38.7
40
41.3
mV/A
Sens(TOP)LT Measured using 33% of full scale IP, TOP = ?40C to 25C
38.5
40
41.5
mV/A
Noise4
VNOISEPP
Peak-to-peak, TA= 25C, 1 nF on VOUT pin to GND
?
36
?
mV
INOISE
Input referred
?
0.4
?
mARMS
/
?(Hz)
Nonlinearity
ELIN
Measured at VOUT around 3.5 V and 4.5 V
?1
?
1
%
Electrical Offset Voltage5,6
VOE(TA)
IP = 0 A, TA = 25C
?10
3
10
mV
VOE(TOP)HT
IP = 0 A, TOP = 25C to 150C
?10
5
10
mV
VOE(TOP)LT
IP = 0 A, TOP = ?40C to 25C
?20
10
20
mV
Electric Offset Voltage
Over Lifetime3
?VOE(LIFE)
TOP = ?40C to 150C, estimated shift after AEC-Q100 grade 0
qualification testing
?
1
?
mV
Total Output Error
ETOT(HT)
Measured using 33% of full scale IP, TOP = 25C to 150C
?3.25
0.8
3.25
%
ETOT(LT)
Measured using 33% of full scale IP, TOP = ?40C to 25C
?3.75
1.5
3.75
%
Total Output Error Including
Lifetime Drift7
ETOT(HT,LIFE) Measured using 33% of full scale IP, TOP = 25C to 150C
?4.1
2.28
4.1
%
ETOT(LT,LIFE)
Measured using 33% of full scale IP, TOP = ?40C to 25C
?5.6
2.98
5.6
%
1
See Characteristic Performance Data page for parameter distributions over temperature range.
2
This parameter may drift a maximum of ?SensLIFE over lifetime.
3
Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot
be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information.
4
3 sigma noise voltage.
5
Drift is referred to ideal VOUT(QU) = 0.5 V.
6
This parameter may drift a maximum of ?VOE(LIFE) over lifetime.
7
The maximum drift of any single device during qualification testing was 4%.


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