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AC0402KRX7R5BN Datasheet(PDF) 15 Page - YAGEO Corporation |
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AC0402KRX7R5BN Datasheet(HTML) 15 Page - YAGEO Corporation |
15 / 24 page Automotive grade NP0 /X7R 6.3 V to 630 V www.yageo.com Mar. 31, 2017 V.6 Surface-Mount Ceramic Multilayer Capacitors 15 24 Product specification SOLDERING CONDITIONS The lead free MLCCs are able to stand the reflow soldering conditions as below: Temperature: above 220 °C Endurance: 95 to 120 seconds Cycles: 3 times The test of "soldering heat resistance" is carried out in accordance with the schedule of "MIL-STD-202F-method 210F", "The robust construction of chip capacitors allows them to be completely immersed in a solder bath of 270 °C for 10 seconds". Therefore, it is possible to mount MLCCs on one side of a PCB and other discrete components on the reverse (mixed PCBs). Surface Mount Capacitors are tested for solderability at 245 °C during 2 seconds. The test condition for no leaching is 260°C for 30 seconds. TEST TEST METHOD PROCEDURE REQUIREMENTS Mounting IEC 60384- 21/22 4.3 The capacitors may be mounted on printed-circuit boards or ceramic substrates No visible damage Capacitance IEC 60384- 21/22 4.5.1 Class 1: At 20 °C, 24 hours after annealing f = 1 MHz for C ≤ 1nF, measuring at voltage 1 Vrms at 20 °C f = 1 KHz for C > 1nF, measuring at voltage 1 Vrms at 20 °C Class 2: At 20 °C, 24 hours after annealing f = 1 KHz, measuring at voltage 1 Vrms at 20 °C Within specified tolerance Dissipation Factor (D.F.) IEC 60384- 21/22 4.5.2 Class 1: At 20 °C, 24 hours after annealing f = 1 MHz for C ≤ 1nF, measuring at voltage 1 Vrms at 20 °C f = 1 KHz for C > 1nF, measuring at voltage 1 Vrms at 20 °C Class 2: At 20 °C, 24 hours after annealing f = 1 KHz, measuring at voltage 1 Vrms at 20 °C In accordance with specification Insulation Resistance IEC 60384- 21/22 4.5.3 At Ur (DC) for 1 minute In accordance with specification SOLDERING RECOMMENDATION Table 15 SOLDERING METHOD SIZE 0402 0603 0805 1206 ≥ 1210 Reflow ≥ 0.1 µF ≥ 1.0 µF ≥ 2.2 µF ≥ 4.7 µF Reflow only Reflow/Wave < 0.1 µF < 1.0 µF < 2.2 µF < 4.7 µF --- TESTS AND REQUIREMENTS Table 16 Test procedures and requirements |
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