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AN616 Datasheet(PDF) 15 Page - Silicon Laboratories

Part No. AN616
Description  This document contains a complete test report that describes
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Maker  SILABS [Silicon Laboratories]
Homepage  http://www.silabs.com
Logo SILABS - Silicon Laboratories

AN616 Datasheet(HTML) 15 Page - Silicon Laboratories

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AN616
Rev. 0.1
15
Test report no.: 4-3476-01-01/11
2011-04-29
Page 14 of 26
9.2
Conducted Immunity with BCI 1-400 MHz
9.2.1 Test Plan
EUT set-up
TX and RX
Test method
Power adjustment
Substitution method
Forward power
Basic standard
Field
strength
Start
frequency
Stop
frequency
Frequency
step
Dwell time
Modulation
ISO 11452-4 (BCI)
200 mA
1 MHz
10 MHz
200 MHz
10 MHz
200 MHz
400 MHz
LIN 1 MHz
LIN 5 MHz
LIN 10 MHz
2 s
1 kHz, AM 80%
Operating mode
Position
Functional
status
Reaction during
and after test
Result
Receiving
150 mm
A
A/A
passed
Test method
Power adjustment
Closed-loop method with power limitation
Forward power
Basic standard
Field
strength
Start
frequency
Stop
frequency
Frequency
step
Dwell time
Modulation
ISO 11452-4 (BCI)
200 mA
1 MHz
100 MHz
100 MHz
400 MHz
LOG 5%
LOG 2%
2 s
1 kHz, AM 80%
Operating mode
Position
Functional
status
Reaction during
and after test
Result
Receiving
900mm / 50 mm
A
B/A
passed
Remarks:
During closed loop method the LED4 stops flashing between 26,3 and 27 MHz
9.2.2 Reaction of EUT:
A
normal performance within the specification limits
B
temporary degradation or loss of function or performance which is self-recoverable
C
temporary degradation or loss of function or performance which requires operator intervention or system reset
D
degradation or loss of function which is not recoverable due to damage of equipment (components) or software,
or loss of data


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