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AN616 Datasheet(PDF) 15 Page - Silicon Laboratories |
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AN616 Datasheet(HTML) 15 Page - Silicon Laboratories |
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15 / 28 page 
AN616 Rev. 0.1 15 Test report no.: 4-3476-01-01/11 2011-04-29 Page 14 of 26 9.2 Conducted Immunity with BCI 1-400 MHz 9.2.1 Test Plan EUT set-up TX and RX Test method Power adjustment Substitution method Forward power Basic standard Field strength Start frequency Stop frequency Frequency step Dwell time Modulation ISO 11452-4 (BCI) 200 mA 1 MHz 10 MHz 200 MHz 10 MHz 200 MHz 400 MHz LIN 1 MHz LIN 5 MHz LIN 10 MHz 2 s 1 kHz, AM 80% Operating mode Position Functional status Reaction during and after test Result Receiving 150 mm A A/A passed Test method Power adjustment Closed-loop method with power limitation Forward power Basic standard Field strength Start frequency Stop frequency Frequency step Dwell time Modulation ISO 11452-4 (BCI) 200 mA 1 MHz 100 MHz 100 MHz 400 MHz LOG 5% LOG 2% 2 s 1 kHz, AM 80% Operating mode Position Functional status Reaction during and after test Result Receiving 900mm / 50 mm A B/A passed Remarks: During closed loop method the LED4 stops flashing between 26,3 and 27 MHz 9.2.2 Reaction of EUT: A normal performance within the specification limits B temporary degradation or loss of function or performance which is self-recoverable C temporary degradation or loss of function or performance which requires operator intervention or system reset D degradation or loss of function which is not recoverable due to damage of equipment (components) or software, or loss of data |
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