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STM8L151C4 Datasheet(PDF) 89 Page - STMicroelectronics |
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STM8L151C4 Datasheet(HTML) 89 Page - STMicroelectronics |
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89 / 142 page  DocID15962 Rev 15 89/142 STM8L151x4/6, STM8L152x4/6 Electrical parameters 115 9.3.6 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDD (for standard pins) should be avoided during normal product operation. However, in order to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error, out of spec current injection on adjacent pins or other functional failure (for example reset, oscillator frequency deviation, LCD levels, etc.). The test results are given in the following table. 9.3.7 I/O port pin characteristics General characteristics Subject to general operating conditions for VDD and TA unless otherwise specified. All unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or an external pull-up or pull-down resistor. Table 37. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on true open-drain pins (PC0 and PC1) -5 +0 mA Injected current on all five-volt tolerant (FT) pins -5 +0 Injected current on all 3.6 V tolerant (TT) pins -5 +0 Injected current on any other pin -5 +5 |
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