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SCANPSC110F Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. SCANPSC110F
Description  SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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SCANPSC110F Datasheet(HTML) 2 Page - National Semiconductor (TI)

 
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Connection Diagrams (Continued)
Order Number
Description
SCANPSC110FFMQB
Military Flatpak
SCANPSC110FDMQB
Military DIP
SCANPSC110FLMQB
Military Leadless Chip Carrier
Pin
Names
Description
TCK
B
Backplane Test Clock Input
TMS
B
Backplane Test Mode Select Input
TDI
B
Backplane Test Data Input
TDO
B
Backplane Test Data Output
TRST
Asynchronous Test Reset Input (Active low)
S
(0,5)
Address Select Port
OE
Local Scan Port Output Enable (Active low)
TCK
L(1–3)
Local Port Test Clock Output
TMS
L(1–3)
Local Port Test Mode Select Output
TDI
L(1–3)
Local Port Test Data Input
TDO
L(1–3)
Local Port Test Data Output
Table of Contents
1.
GLOSSARY OF TERMS:
2
2.
DETAILED PIN DESCRIPTION TABLE:
3
3.
OVERVIEW OF SCAN BRIDGE FUNCTIONS:
4
A. SCANPSC110F Bridge Architecture:
4
B. SCANPSC110F Bridge State Machines:
4
4.
TESTER/SCANPSC110F BRIDGE INTERFACE:
8
5.
REGISTER SET:
8
6.
ADDRESSING SCHEME:
8
7.
HIERARCHICAL TEST SUPPORT:
9
8.
LEVEL 1 PROTOCOL:
9
A. Addressing Modes:
9
B. Direct Addressing:
10
C. Broadcast Addressing:
10
D. Multi-Cast Addressing:
10
9.
LEVEL 2 PROTOCOL:
11
A. Level 2 Instruction Types:
11
B. Level 2 Instruction Descriptions:
12
10. REGISTER DESCRIPTIONS:
14
11. SPECIAL FEATURES:
16
A. BIST Support:
16
B. RESET:
16
C. Port Synchronization:
16
12. ABSOLUTE MAXIMUM RATINGS:
18
13. RECOMMENDED OPERATING CONDITIONS:
18
14. DC ELECTRICAL CHARACTERISTICS:
18
15. AC ELECTRICAL CHARACTERISTICS:
20
16. AC WAVEFORMS:
22
17. APPENDIX:
24
A. State Diagram for Boundary-Scan TAP Control-
ler:
24
18. APPLICATIONS EXAMPLE:
24
TABLE 1. Glossary of Terms
LFSR
Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial
test data.
LSP
Local Scan Port. A four signal port that drives a “local” (i.e. non-backplane) scan chain. (e.g.,
TCK
L1, TMSL1, TDOL1, TDIL1)
Local
Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge
Test Access Port that drives them. The term “local” was adopted from the system test architecture
that the ’PSC110F Bridge will most commonly be used in; namely, a system test backplane with a
’PSC110F Bridge on each card driving up to 3 “local” scan rings per card. (Each card can contain
multiple ’PSC110Fs, with 3 local scan ports per ’PSC110F.)
Park/Unpark
Park, parked, unpark, and unparked, are used to describe the state of the LSP controller and the
state of the local TAP controllers (the “local TAP controllers” refers to the TAP controllers of the
scan components that make up a local scan ring). Park is also used to describe the action of
parking a LSP (transitioning into one of the Parked LSP controller states). It is important to
understand that when a LSP controller is in one of the parked states, TMS
L is held constant,
thereby holding or “parking” the local TAP controllers in a given state.
TAP
Test Access Port as defined by IEEE Std. 1149.1
Selected/Unselected
Selected and Unselected refers to the state of the ’PSC110F Bridge Selection Controller. A
selected ’PSC110F has been properly addressed and is ready to receive Level 2 protocol.
Unselected ’PSC110Fs monitor the system test backplane, but do not accept Level 2 protocol
(except for the
GOTOWAIT instruction). The data registers and LSPs of unselected ’PSC110Fs are
not accessible from the system test master.
www.national.com
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