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LMK04828 Datasheet(PDF) 6 Page - Texas Instruments

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Part # LMK04828
Description  Ultra-Low-Noise, JESD204B-Compliant Clock Jitter Cleaner
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LMK04828 Datasheet(HTML) 6 Page - Texas Instruments

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6
LMK04828-EP
SNAS703 – APRIL 2017
www.ti.com
Product Folder Links: LMK04828-EP
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Copyright © 2017, Texas Instruments Incorporated
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, High-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter, ΨJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining RθJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter, ΨJB estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining RθJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7)
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
7.4 Thermal Information
THERMAL METRIC(1)
LMK04828-EP
UNIT
NKD (WQFN)
64 PINS
RθJA
Junction-to-ambient thermal resistance(2)
24.3
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance(3)
6.1
°C/W
RθJB
Junction-to-board thermal resistance(4)
3.5
°C/W
ψJT
Junction-to-top characterization parameter(5)
0.1
°C/W
ψJB
Junction-to-board characterization parameter(6)
3.5
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance(7)
0.7
°C/W
(1)
See the applications section of Power Supply Recommendations for ICC for specific part configuration and how to calculate ICC for a
specific design.
(2)
To meet the jitter performance listed in the subsequent sections of this data sheet, the minimum recommended slew rate for all input
clocks is 0.5 V/ns. This is especially true for single-ended clocks. Phase noise performance will begin to degrade as the clock input slew
rate is reduced. However, the device functions at slew rates down to the minimum listed. When compared to single-ended clocks,
differential clocks (LVDS, LVPECL) will be less susceptible to degradation in phase noise performance at lower slew rates due to their
common mode noise rejection. However, it is also recommended to use the highest possible slew rate for differential clocks to achieve
optimal phase noise performance at the device outputs.
(3)
See Differential Voltage Measurement Terminology for definition of VID and VOD voltages.
7.5 Electrical Characteristics
(3.15 V < VCC < 3.45 V, –55 °C < TA < +105°C. Typical values at VCC = 3.3 V, TA = 25 °C, at the recommended operating
conditions and are not assured.)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CURRENT CONSUMPTION
ICC_PD
Power-down supply current
1
3
mA
ICC_CLKS
Supply current(1)
14 HSDS 8 mA clocks enabled
PLL1 and PLL2 locked.
565
670
mA
CLKin0/0*, CLKin1/1*, and CLKin2/2* INPUT CLOCK SPECIFICATIONS
fCLKin
Clock input frequency
0.001
750
MHz
SLEWCLKin
Clock input slew rate (2)
20% to 80%
0.15
0.5
V/ns
VIDCLKin
Differential clock input voltage(3)
See Figure 4
AC-coupled
0.125
1.55
|V|
VSSCLKin
0.25
3.1
Vpp
VCLKin
Clock input
Single-ended input voltage
AC-coupled to CLKinX;
CLKinX* AC-coupled to Ground
CLKinX_TYPE = 0 (Bipolar)
0.25
2.4
Vpp
AC-coupled to CLKinX;
CLKinX* AC-coupled to Ground
CLKinX_TYPE = 1 (MOS)
0.35
2.4
Vpp
|VCLKinX-offset|
DC offset voltage between
CLKinX/CLKinX* (CLKinX* - CLKinX)
Each pin is AC-coupled, CLKin0/1/2
CLKinX_TYPE = 0 (Bipolar)
0
|mV|
Each pin is AC-coupled, CLKin0/1
CLKinX_TYPE = 1 (MOS)
55
|mV|
DC offset voltage between
CLKin2/CLKin2* (CLKin2* - CLKin2)
Each pin is AC-coupled
CLKinX_TYPE = 1 (MOS)
20
|mV|
VCLKin- VIH
High input voltage
DC-coupled to CLKinX;
CLKinX* AC-coupled to Ground
CLKinX_TYPE = 1 (MOS)
2
VCC
V
VCLKin– VIL
Low input voltage
0
0.4
V


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