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SN74LVTH18514DGGR Datasheet(PDF) 1 Page - Texas Instruments |
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SN74LVTH18514DGGR Datasheet(HTML) 1 Page - Texas Instruments |
1 / 38 page SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments (TI™) SCOPE ™ Family of Testability Products D Members of the TI Widebus™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors D B-Port Outputs of ’LVTH182514 Devices Have Equivalent 25- Ω Series Resistors, So No External Resistors Are Required D Compatible With the IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Package Options Include 64-Pin Plastic Thin Shrink Small-Outline (DGG) and 64-Pin Ceramic Dual Flat (HKC) Packages Using 0.5-mm Center-to-Center Spacings description The ’LVTH18514 and ’LVTH182514 scan test devices with 20-bit universal bus transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment. Copyright © 1998, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. SCOPE, Widebus, UBT, and TI are trademarks of Texas Instruments Incorporated. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SN54LVTH18514, SN54LVTH182514 . . . HKC PACKAGE SN74LVTH18514, SN74LVTH182514 . . . DGG PACKAGE (TOP VIEW) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 LEBA OEBA A1 A2 A3 GND A4 A5 A6 VCC A7 A8 A9 GND A10 A11 A12 A13 GND A14 A15 A16 VCC A17 A18 A19 GND A20 CLKENAB CLKAB TDO TMS CLKBA CLKENBA B1 B2 B3 GND B4 B5 B6 VCC B7 B8 B9 GND B10 B11 B12 B13 GND B14 B15 B16 VCC B17 B18 B19 GND B20 OEAB LEAB TDI TCK |
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