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LP2981-50 Datasheet(PDF) 3 Page - Texas Instruments |
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LP2981-50 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 22 page 1 VIN 2 GND 3 ON/OFF 4 NC 5 VOUT Not to scale 3 LP2981-28, LP2981-29, LP2981-30 LP2981-33, LP2981-50, LP2981A-28 LP2981A-29, LP2981A-30, LP2981A-33, LP2981A-50 www.ti.com SLVS521G – JULY 2004 – REVISED AUGUST 2016 Product Folder Links: LP2981-28 LP2981-29 LP2981-30 LP2981-33 LP2981-50 LP2981A-28 LP2981A-29 LP2981A- 30 LP2981A-33 LP2981A-50 Submit Documentation Feedback Copyright © 2004–2016, Texas Instruments Incorporated 5 Pin Configuration and Functions DBV Package 5-Pin SOT-23 Top View Pin Functions PIN I/O DESCRIPTION NO. NAME 1 VIN I Supply input 2 GND — Ground 3 ON/OFF I Active-low shutdown pin. Tie to VIN if unused. 4 NC — No connect 5 VOUT O Voltage output (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The PNP pass transistor has a parasitic diode connected between the input and output. This diode normally is reverse-biased (VIN > VOUT), but is forward-biased if the output voltage exceeds the input voltage by a diode drop (see Application and Implementation for more details). (3) If load is returned to a negative power supply, the output must be diode clamped to GND. 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VIN Continuous input voltage(2) –0.3 16 V VON/OFF ON/OFF input voltage –0.3 16 V VOUT Output voltage(3) –0.3 9 V IOUT Output current Internally limited (short-circuit protected) TJ Operating virtual junction temperature 150 °C Tstg Storage temperature –65 150 °C (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1000 Machine model (MM) ±200 |
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