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MM54C165 Datasheet(PDF) 3 Page - National Semiconductor (TI) |
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MM54C165 Datasheet(HTML) 3 Page - National Semiconductor (TI) |
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AC Electrical Characteristics TA e 25 C CL e 50 pF unless otherwise noted Symbol Parameter Conditions Min Typ Max Units tpd0 tpd1 Propagation Delay Time to a Logical ‘‘0’’ or VCC e 5V 200 400 ns Logical ‘‘1’’ from Clock or Load to Q or Q VCC e 10V 80 200 ns tpd0 tpd1 Propagation Delay Time to a Logical ‘‘0’’ or VCC e 5V 200 400 ns Logical ‘‘1’’ from H to Q or Q VCC e 10V 80 200 ns tS Clock Inhibit Set-up Time VCC e 5V 150 75 ns VCC e 10V 60 30 ns tS Serial Input Set-up Time VCC e 5V 50 25 ns VCC e 10V 30 15 ns tH Serial Input Hold Time VCC e 5V 50 0 ns VCC e 10V 30 0 ns tS Parallel Input Set-Up Time VCC e 5V 150 75 ns VCC e 10V 60 30 ns tH Parallel Input Hold Time VCC e 5V 50 0 ns VCC e 10V 30 0 ns tW Minimum Clock Pulse Width VCC e 5V 70 200 ns VCC e 10V 30 100 ns tW Minimum Load Pulse Width VCC e 5V 85 180 ns VCC e 10V 30 90 ns fMAX Maximum Clock Frequency VCC e 5V 25 6 MHz VCC e 10V 5 12 MHz tr tf Maximum Clock Rise and Fall Time VCC e 5V 10 m s VCC e 10V 5 m s CIN Input Capacitance (Note 2) 5 pF CPD Power Dissipation Capacitance (Note 3) 65 pF AC Parameters are guaranteed by DC correlated testing Note 1 ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation Note 2 Capacitance is guaranteed by periodic testing Note 3 CPD determines the no load AC power consumption of any CMOS device For complete explanation see 54C74C Family Characteristics application note AN-90 Switching Time Waveform TLF5897 – 4 Note A The remaining six data and the serial input are low Note B Prior to test high level data is loaded into the P7 input 3 |
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