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LMX3162 Datasheet(PDF) 11 Page - National Semiconductor (TI) |
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LMX3162 Datasheet(HTML) 11 Page - National Semiconductor (TI) |
11 / 18 page Typical Performance Characteristics (Continued) AC Timing Characteristics Serial Data Input Timing TEST CONDITIONS: The Serial Data Input Timing is tested using a symmetrical waveform around V CC/2. The test waveform has an skew rate of 0.6V/ns. SSB Mixer Noise Figure vs RF IN Frequency DS100929-47 SSB Mixer Noise Figure vs F IN Power DS100929-48 TX Power Out vs F IN Power DS100929-49 TX Power Out vs F IN Frequency DS100929-50 DS100929-3 Notes: Parenthesis data indicates programmable reference divider data. Data shifted into register on clock rising edge. Data is shifted in MSB first. www.national.com 11 |
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