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PE0201FKF470R91L Datasheet(PDF) 10 Page - YAGEO Corporation

Part # PE0201FKF470R91L
Description  CURRENT SENSOR - LOW TCR AUTOMOTIVE GRADE
Download  12 Pages
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Manufacturer  YAGEO [YAGEO Corporation]
Direct Link  http://www.yageo.com
Logo YAGEO - YAGEO Corporation

PE0201FKF470R91L Datasheet(HTML) 10 Page - YAGEO Corporation

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Chip Resistor Surface Mount
www.yageo.com
Nov. 28, 2016 V.5
Product specification
10
12
SERIES
PE_L
0201 /0402/ 0603/ 0805/ 1206/ 2010/ 2512
TESTS AND REQUIREMENTS
TEST
TEST METHOD
PROCEDURE
REQUIREMENTS
Life/
Operational Life/
Endurance
MIL-STD-202G-method 108
IEC 60115-1 4.25.1
1,000 hours at 70± 2 °C applied RCWV
1.5 hours on, 0.5 hour off, still air required
± (1%+0.0005 Ω)
High
Temperature
Exposure/
Endurance at
Upper Category
Temperature
MIL-STD-202G-method 108
IEC 60115-1 4.25.3
1,000 hours at maximum operating temperature
depending on specification, unpowered
No direct impingement of forced air to the parts
Tolerances:
0201/0402 155± 3℃
0603 and above 170± 3℃
± (1%+0.0005 Ω)
Moisture
Resistance
MIL-STD-202G-method 106
Each temperature / humidity cycle is defined at 8
hours (method 106F), 3 cycles / 24 hours for 10d
with 25 °C / 65 °C 95% R.H, without steps 7a &
7b, unpowered
Parts mounted on test-boards, without
condensation on parts
Measurement at 24± 2 hours after
test conclusion
± (0.5%+0.0005 Ω)
Thermal Shock
MIL-STD-202G-method 107
-55/+125 °C
Note: Number of cycles required is 300.
Devices mounted
Maximum transfer time is 20 seconds.
Dwell time is 15 minutes. Air – Air
±(1%+0.0005 Ω)
Short Time
Overload
IEC60115-1 4.13
5 times of rated power for 5 seconds at room
temperature
± (1%+0.0005 Ω)
No visible damage
Board Flex/
Bending
IEC60115-1 4.33
Device mounted on PCB test board as described,
only 1 board bending required
Bending for
0201: 3mm
0402 and above: 2mm
Holding time: minimum 60 seconds
± (1%+0.0005 Ω)
No visible damage
Biased Humidity
MIL-STD-202
Method 103
1,000 hours at 85ºC/85%R.H. 10% of operating
power, no condensation on the devices, circulating
air.
± (1.0 % + 0.0005Ω)
Table 8 Test condition, procedure and requirements


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