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AF9435P Datasheet(PDF) 2 Page - Anachip Corp |
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AF9435P Datasheet(HTML) 2 Page - Anachip Corp |
2 / 5 page AF9435P P-Channel 30-V (D-S) MOSFET Anachip Corp. www.anachip.com.tw Rev. 1.1 Jul 20, 2004 2/5 Absolute Maximum Ratings (T A=25ºC unless otherwise noted) Symbol Parameter Rating Units VDS Drain-Source Voltage -30 V VGS Gate-Source Voltage ±25 V TA=25ºC ±6.5 ID Continuous Drain Current (Note 1) TA=70ºC ±5.2 A IDM Pulsed Drain Current (Note 2) ±30 A IS Continuous Source Current (Diode Conduction) (Note 1) -1.6 A TA=25ºC 3.1 PD Power Dissipation (Note 1) TA=70ºC 2.0 W TJ, TSTG Operating Junction and Storage Temperature Range -55 to 150 ºC Thermal Resistance Ratings Symbol Parameter Maximum Units RθJC Maximum Junction-to-Case (Note 1) t < 5 sec 25 ºC/W RθJA Maximum Junction-to-Ambient (Note 1) t < 5 sec 40 ºC/W Note 1: surface Mounted on 1”x 1” FR4 Board. Note 2: Pulse width limited by maximum junction temperature Specifications (T A=25ºC unless otherwise noted) Limits Symbol Parameter Test Conditions Min. Typ. Max. Unit Static V(BR)DSS Drain-Source breakdown Voltage VGS=0V, ID=-250uA -30 - - V VGS(th) Gate-Threshold Voltage VDS= VGS, ID=-250uA -1 -1.6 -3 V IGSS Gate-Body Leakage VDS=0V, VGS=±25V - - ±100 nA VDS=-24V, VGS=0V - - -1 IDSS Zero Gate Voltage Drain Current VDS=-24V, VGS=0V, TJ=55ºC - - -5 uA ID(on) On-State Drain Current (Note 3) VDS=-5V, VGS=-10V -30 - - A VGS=-10V, ID=-5.7A - 38 49 VGS=-4.5V, ID=-5.0A - 54 69 rDS(on) Drain-Source On-Resistance (Note 3) VGS=-10V, ID=-5.7A, TJ=55ºC - 42 54 mΩ gfs Forward Tranconductance (Note 3) VDS=-15V, ID=-5.7A - 19 - S VSD Diode Forward Voltage IS=-2.1A, VGS=0V - -0.7 -1.2 V Dynamic (Note 4) Qg Total Gate Charge - 6 11 Qgs Gate-Source Charge - 2.0 - Qgd Gate-Drain Charge VDS=-15V, VGS=-4.5V, ID=-5.7A - 2.7 - nC Switching td(on) Turn-On Delay Time - 7 14 tr Rise Time - 13 24 td(off) Turn-Off Delay Time - 14 25 tf Fall-Time VDD=-15, RL=15Ω, ID=-1A, VGEN=-10V, RG=6Ω - 9 17 nS Note 3: Pulse test: PW < 300us duty cycle < 2%. Note 4: Guaranteed by design, not subject to production testing. |
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