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Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional,

but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply

only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.

Note 2: All voltages are measured with respect to GND=

maximum package input current rating limits the number of pins that can simultaneously safely exceed the power supplies with an input current of 25mA to two.

is 84°C/W for the M20B SOIC package

.

Note 5: Human body model, 100pF capacitor discharged through a 1.5k

Ω resistor.

Note 6: See AN450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in any National Semiconductor Linear

Data Book for other methods of soldering surface mount devices.

AC Electrical Characteristics

limits apply for T

Symbol

Parameter

Conditions

Typical

(Note 9)

Limits

(Note 10)

Units

(Limits)

f

MCLK

24

MHz (min)

MCLK

Duty Cycle

40

60

% (min)

% (max)

MCLK

period

41

ns (min)

SampCLK

falling edge

3

SampCLK

period

4

50

ns (min)

50

ns (min)

SampCLK

falling edge before rising

4

ns (min)

data

40

ns (max)

hold time of current data from falling

15

ns (min)

D2

(SCLK) Serial Clock Period

1

Input data setup time before

D2

(SCLK) rising edge

0

ns (min)

rising edge

3

ns (min)

D2

(SCLK) rising edge after bit B0

3

ns (min)

D1

(Latch) rising edge before next

D2

(SCLK) rising edge

3

ns (min)

3

D1

falling edge

3

(min)