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DAC6574 Datasheet(PDF) 2 Page - Texas Instruments

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Part No. DAC6574
Description  QUAD, 10-BIT, LOW-POWER, VOLTAGE OUTPUT, IC INTERFACE DIGITAL-TO-ANALOG CONVERTER
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

DAC6574 Datasheet(HTML) 2 Page - Texas Instruments

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A1
A0
1
2
3
4
5
6
7
8
10
9
VOUTA
VOUTB
GND
VOUTC
VOUTD
VDD
SDA
SCL
DAC6574
.
ABSOLUTE MAXIMUM RATINGS
(1)
DAC6574
SLAS408 – DECEMBER 2003
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
PRODUCT
PACKAGE
PACKAGE
SPECIFICATION
PACKAGE
ORDERING
TRANSPORT MEDIA
DRAWING
TEMPERATURE
MARKING
NUMBER
NUMBER
RANGE
DAC6574
10-MSOP
DGS
–40
°C TO +105°C
D674
DAC6574IDGS
80 Piece Tube
DAC6574IDGSR
2500 Piece Tape and Reel
DGS PACKAGE
PIN DESCRIPTIONS
(TOPVIEW)
PIN
NAME
DESCRIPTION
1
VOUTA
Analog output voltage from DAC A
2
VOUTB
Analog output voltage from DAC B
Ground reference point for all circuitry on the
3
GND
part
4
VOUTC
Analog output voltage from DAC C
5
VOUTD
Analog output voltage from DAC D
6
SCL
Serial clock input
7
SDA
Serial data input and output
8
VDD
Analog voltage supply input
9
A0
Device address select - I2C
10
A1
Device address select - I2C
VDD to GND
–0.3 V to +6 V
Digital input voltage to GND
–0.3 V to VDD + 0.3 V
VOUT to GND
–0.3 V to VDD + 0.3 V
Operating temperature range
–40
°C to +105°C
Storage temperature range
–65
°C to +150°C
Junction temperature range (TJ max)
+150
°C
Power dissipation:
Thermal impedance (
ΘJA)
270
°C/W
Thermal impedance (
ΘJC)
77
°C/W
Lead temperature, soldering:
Vapor phase (60s)
215
°C
Infrared (15s)
220
°C
(1)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2


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