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CAT34RC02YITE13REV-E Datasheet(PDF) 2 Page - Catalyst Semiconductor |
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CAT34RC02YITE13REV-E Datasheet(HTML) 2 Page - Catalyst Semiconductor |
2 / 16 page CAT34RC02 2 Doc. No. 1052, Rev. K CAPACITANCE TA = 25°C, f = 400 kHz, VCC = 5 V Symbol Test Conditions Min Typ Max Units CI/O(2) Input/Output Capacitance (SDA) VI/O = 0 V 8 pF CIN(2) Input Capacitance (other pins) VIN = 0 V 6 pF ZWPL WP Input Impedance VIN < 0.5 V 5 70 k Ω ZWPH WP Input Impedance VIN > VCC x 0.7 500 k Ω RELIABILITY CHARACTERISTICS Symbol Parameter Reference Test Method Min Units NEND(2)(*) Endurance MIL-STD-883, Test Method 1033 1,000,000 Program/ Erase Cycles TDR(2)(*) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP(2)(*) ESD Susceptibility MIL-STD-883, Test Method 3015 4000 Volts ILTH(2)(3) Latch-up JEDEC Standard 17 100 mA ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias .................. -55 °C to +125°C Storage Temperature ........................ -65 °C to +150°C Voltage on Any Pin with Respect to Ground(1) ............ -2.0 V to VCC + 2.0 V Voltage on A0 .................................................. -2.0 V to +12.0 V VCC with Respect to VSS .............................. -2.0 V to +7.0 V Note: (1) The DC input voltage on any pin should not be lower than -0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than -2.0 V or overshoot to no more than VCC + 2.0 V, for periods of less than 20 ns. The maximum DC voltage on address pin A0 is +12.0 V. (2) This parameter is tested initially and after a design or process change that affects the parameter. (3) Latch-up protection is provided for stresses up to 100 mA on I/O pins from -1.0 V to VCC + 1.0 V. (4) Standby Current, ISB = 10 µA max at extended temperature range. *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. (*) Page Mode, VCC = 5 V, 25 °C D.C. OPERATING CHARACTERISTICS VCC = 1.7 V to 5.5 V, unless otherwise specified. Symbol Parameter Test Conditions Min Typ Max Units ICC Power Supply Current (Read) fSCL = 100 kHz 1 mA ICC Power Supply Current (Write) fSCL = 100 kHz 3 mA ISB(4) Standby Current (VCC = 5.0 V) VIN = GND or VCC 1 µA ILI Input Leakage Current VIN = GND to VCC 1 µA ILO Output Leakage Current VOUT = GND to VCC 1 µA VIL Input Low Voltage –1VCC x 0.3 V VIH Input High Voltage VCC x 0.7 VCC + 1.0 V VOL1 Output Low Voltage (VCC = 3.0 V) IOL = 3 mA 0.4 V VOL2 Output Low Voltage (VCC = 1.7 V) IOL = 1.5 mA 0.5 V VHV RSWP Set/Clear Overdrive VHV - VCC > 4.8 V 7 10 V A0 High Voltage |
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