PACKAGE/ORDERING INFORMATION

ABSOLUTE MAXIMUM RATINGS

(1)

DDC316

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

For the most current package and ordering information, see the Package Option Addendum at the end of this

document, or see the TI web site at www.ti.com.

AVDD to AGND

–0.3V to +6V

DVDD to DGND

–0.3V to +3.6V

AGND to DGND

±0.2V

VREF Input to AGND

2.0V to AVDD + 0.3V

Analog Input to AGND

–0.3V to +0.7V

Digital Input Voltage to DGND

–0.3V to DVDD + 0.3V

Digital Output Voltage to DGND

–0.3V to AVDD + 0.3V

Operating Temperature

0°C to +70°C

Storage Temperature

–60°C to +150°C

+150°C

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

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