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TSL245 Datasheet(PDF) 5 Page - Texas Instruments

Part # TSL245
Description  INFRARED LIGHT-TO-FREQUENCY CONVERTER
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TSL245 Datasheet(HTML) 5 Page - Texas Instruments

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TSL245
INFRARED LIGHT-TO-FREQUENCY CONVERTER
SOES018 – MAY 1995
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
APPLICATION INFORMATION
power-supply considerations
For optimum device performance, power-supply lines should be decoupled by a 0.01-
µF to 0.1-µF capacitor
with short leads (see Figure 7).
output interface
The output of the device is designed to drive a standard TTL or CMOS logic input over short distances. If lines
greater than 12 inches are used on the output, a buffer or line driver is recommended.
measuring the frequency
The choice of interface and measurement techniques depends on the desired resolution and data-acquisition
rate. For maximum data-acquisition rate, period-measurement techniques should be used.
Period measurement requires using a fast reference clock with available resolution directly related to reference
clock rate. The technique measures rapidly varying light levels or provides a fast measurement of a constant
light source.
Maximum resolution and accuracy can be obtained using frequency-measurement, pulse-accumulation, or
integration techniques. Frequency measurements provide the added benefit of averaging random- or
high-frequency variations (jitter) resulting from noise in the light signal. Resolution is limited primarily by
available counter registers and allowable measurement time. Frequency measurement is well suited for slowly
varying or constant light levels and for reading average light levels over short periods of time. Integration, the
accumulation of pulses over a very long period of time, can be used to measure exposure – the amount of light
present in an area over a given time period.
TSL245
Timer / Port
MCU
0.1
µF
VDD
2
3
1
Figure 7. Typical TSL245 Interface to a Microcontroller


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