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MA838 Datasheet(PDF) 3 Page - Zarlink Semiconductor Inc

Part # MA838
Description  SINGLE PHASE PULSE WIDTH MODULATION WAVEFORM GENERATOR
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Manufacturer  ZARLINK [Zarlink Semiconductor Inc]
Direct Link  http://www.zarlink.com
Logo ZARLINK - Zarlink Semiconductor Inc

MA838 Datasheet(HTML) 3 Page - Zarlink Semiconductor Inc

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MA838
ABSOLUTE MAXIMUM RATINGS
Supply voltage, VDD
10V
Voltage on any pin
VSS-0.3V to VDD +0.3V
Current through any I/O pin
±10mA
Storage temperature (see note)
-65°C to +125°C
Operating temperature range (commercial)
0°C to +70°C
Operating temperature range (industrial)
-40°C to +85°C
NOTE: These temperature ranges apply to all package types.
Many package types are available and extended temperature
ranges can be offered for some packages. Further information
is available on request.
1
6
MA838-2
Pure sinewave:
x(t) = A [sin ( t)]
Additional wave shapes can be implemented to order, provided
they are symmetrical about the 90°, 180° and 270° axes.
Contact your local GEC Plessey Semiconductors Customer
Service Centre for further details.
PRODUCT DESIGNATION
Two standard options exist, defining waveform shape.
These are designated MA838-1 and MA838-2 as follows:
MA838-1
Sine + third harmonic at one sixth the amplitude of the
fundamental:
x(t) = A [sin ( t) + sin 3( t)]
DC ELECTRICAL CHARACTERISTICS
Test conditions (unless otherwise stated):
VDD = 5V±5%, Tamb = 25°C
Characteristic
Symbol
Min.
Typ.
Max.
Units
Conditions
Input high voltage
VIH
2.0
-
-
V
Input low voltage
VIL
-
-
0.8
V
Input leakage current
IIN
-
-
10
µA
VIN = VSS or VDD
Output high voltage
VOH
4.0
>4.5
-
V
IOH = -4mA
Output low voltage
VOL
-
<0.2
0.4
V
IOH = 4mA
Supply current (static)
IDD (static)
-
-
100
µA
all outputs open circuit
(dynamic)
IDD (dynamic)
-
<10
20
mA
CLK = 10MHz
Supply voltage
VDD
2.7
5.0
5.5
V
AC ELECTRICAL CHARACTERISTICS
Test conditions (unless otherwise stated):
VDD = 5V±5%, Tamb = 25°C
Characteristic
Symbol
Min.
Typ.
Max.
Units
Conditions
Clock frequency
fCLK
-
-
12.5
MHz
M:S ratio 1:1 ±20%
SET TRIP = 0
→ Outputs tripped
tTRIP
-
2/fCLK
3/fCLK
s
→ TRIP = 0
-
2/fCLK
3/fCLK
s
Stresses above those listed in the Absolute Maximum
Ratings may cause permanent damage to the device. These
are stress ratings only and functional operation of the device at
these conditions, or at any other condition above those indicated
in the operations section of this specification, is not implied.
Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability.


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