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MA838 Datasheet(PDF) 3 Page - Zarlink Semiconductor Inc |
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MA838 Datasheet(HTML) 3 Page - Zarlink Semiconductor Inc |
3 / 13 page 2 MA838 ABSOLUTE MAXIMUM RATINGS Supply voltage, VDD 10V Voltage on any pin VSS-0.3V to VDD +0.3V Current through any I/O pin ±10mA Storage temperature (see note) -65°C to +125°C Operating temperature range (commercial) 0°C to +70°C Operating temperature range (industrial) -40°C to +85°C NOTE: These temperature ranges apply to all package types. Many package types are available and extended temperature ranges can be offered for some packages. Further information is available on request. 1 6 MA838-2 Pure sinewave: x(t) = A [sin ( t)] Additional wave shapes can be implemented to order, provided they are symmetrical about the 90°, 180° and 270° axes. Contact your local GEC Plessey Semiconductors Customer Service Centre for further details. PRODUCT DESIGNATION Two standard options exist, defining waveform shape. These are designated MA838-1 and MA838-2 as follows: MA838-1 Sine + third harmonic at one sixth the amplitude of the fundamental: x(t) = A [sin ( t) + sin 3( t)] DC ELECTRICAL CHARACTERISTICS Test conditions (unless otherwise stated): VDD = 5V±5%, Tamb = 25°C Characteristic Symbol Min. Typ. Max. Units Conditions Input high voltage VIH 2.0 - - V Input low voltage VIL - - 0.8 V Input leakage current IIN - - 10 µA VIN = VSS or VDD Output high voltage VOH 4.0 >4.5 - V IOH = -4mA Output low voltage VOL - <0.2 0.4 V IOH = 4mA Supply current (static) IDD (static) - - 100 µA all outputs open circuit (dynamic) IDD (dynamic) - <10 20 mA CLK = 10MHz Supply voltage VDD 2.7 5.0 5.5 V AC ELECTRICAL CHARACTERISTICS Test conditions (unless otherwise stated): VDD = 5V±5%, Tamb = 25°C Characteristic Symbol Min. Typ. Max. Units Conditions Clock frequency fCLK - - 12.5 MHz M:S ratio 1:1 ±20% SET TRIP = 0 → Outputs tripped tTRIP - 2/fCLK 3/fCLK s → TRIP = 0 - 2/fCLK 3/fCLK s Stresses above those listed in the Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these conditions, or at any other condition above those indicated in the operations section of this specification, is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. |
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