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R1510S012C-T1-FE Datasheet(PDF) 6 Page - RICOH electronics devices division

Part # R1510S012C-T1-FE
Description  Input Voltage Range (Maximum Rating) Max. 36.0V (50V)
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Manufacturer  RICOH [RICOH electronics devices division]
Direct Link  http://www.ricoh.com
Logo RICOH - RICOH electronics devices division

R1510S012C-T1-FE Datasheet(HTML) 6 Page - RICOH electronics devices division

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R1510S
NO.EA-185-140724
6
VIN=14.0V, CE=5.0V, COUT=6.8µF, Rpull-up=100kΩ, Vpull-up=5.0V, unless otherwise noted.
The specifications surrounded by
are guaranteed by design engineering at -40°C ≤ Ta ≤ 105°C.
VR (Continued)
(Ta=25°C)
Symbol
Item
Conditions
Min.
Typ.
Max.
Unit
ISC
Short Current Limit
VOUT=0V
50
mA
VCEH
CE Input Voltage “H”
1.5
5.5
V
VCEL
CE Input Voltage “L”
0.7
V
VD
(Ta=25°C)
Symbol
Item
Conditions
Min.
Typ.
Max.
Unit
-VDET
Detector Threshold
VIN Detector
Setting Voltage
Range:
2.3 V to 12.0V
Ta=25°C
×0.983
×1.017
V
-40°C ≤ Ta ≤ 105°C
×0.97
×1.03
VHYS
Detector Threshold
Hysteresis
-VDET
×0.025
-VDET
×0.05
-VDET
×0.075
V
VDDL
Minimum Operating
Voltage*1
1.8
V
IOUT2
Output Current
(Nch Driver)
VIN ≥ 1.8V, DOUT=0.1V
0.59
mA
VIN ≥ 3.0V, DOUT=0.1V
1.16
VIN ≥ 4.0V, DOUT=0.1V
1.39
ILEAK
Nch Driver Leakage
Current
DOUT=7V
0.33
μA
VRESET
Pull-up Voltage
5.5
V
Δ-VDET/ΔTa
Detector Threshold
Temperature
Coefficient
-40°C ≤ Ta ≤ 105°C
±100
ppm
/°C
tPLH
Release Output
Delay Time*2
20
μs
All test items listed under Electrical Characteristics are done under the pulse load condition (Tj≈Ta=25°C) except
Output Voltage Temperature Coefficient and Detector Threshold Temperature Coefficient.
∗1) Minimum operating voltage is defined as the power supply voltage of which output voltage becomes lower
than 0.1V at the detection.
∗2) Release output delay time is defined as the time to be taken for VIN to change from 2V to (-VDET) +1V, and
for DOUT output to become “H”.
RECOMMENDED OPERATING CONDITIONS
(ELECTRICAL CHARACTERISTICS)
All of electronic equipment should be designed that the mounted semiconductor devices operate within the
recommended operating conditions. The semiconductor devices cannot operate normally over the recommended
operating conditions, even if when they are used over such conditions by momentary electronic noise or surge. And the
semiconductor devices may receive serious damage when they continue to operate over the recommended operating
conditions.


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