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MCM69F737 Datasheet(PDF) 10 Page - Motorola, Inc

Part No. MCM69F737
Description  128K x 36 Bit Flow?밫hrough BurstRAM Synchronous Fast Static RAM
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Manufacturer  MOTOROLA [Motorola, Inc]
Direct Link  http://www.freescale.com
Logo MOTOROLA - Motorola, Inc

MCM69F737 Datasheet(HTML) 10 Page - Motorola, Inc

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MCM69F737
10
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V + 10%, – 5%, TA = 0 to 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level
1.25 V
. . . . . . . . . . . . . .
Input Pulse Levels
0 to 2.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time
1.0 V/ns (20 to 80%)
. . . . . . . . . . . . . . . . . . . . . .
Output Timing Reference Level
1.25 V
. . . . . . . . . . . . . . . . . . . . . . . . .
Output Load
See Figure 2 Unless Otherwise Noted
. . . . . . . . . . . . . .
READ/WRITE CYCLE TIMING (See Notes 1 and 2)
P
Sb l
MCM69F737–7.5
117 MHz
MCM69F737–8
100 MHz
MCM69F737–8.5
90 MHz
MCM69F737–11
50 MHz
Ui
N
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Cycle Time
tKHKH
8.5
10
11
20
ns
Clock High Pulse Width
tKHKL
3
4
4.5
4.5
ns
Clock Low Pulse Width
tKLKH
3
4
4.5
4.5
ns
Clock Access Time
tKHQV
7.5
8
8.5
11
ns
Output Enable to Output
Valid
tGLQV
3.5
3.5
3.5
3.5
ns
Clock High to Output Active
tKHQX1
0
0
0
0
ns
3, 4, 5
Clock High to Output
Change
tKHQX2
2
2
2
2
ns
3, 4
Output Enable to Output
Active
tGLQX
0
0
0
0
ns
3, 4
Output Disable to Q High–Z
tGHQZ
3.5
3.5
3.5
3.5
ns
3, 4
Clock High to Q High–Z
tKHQZ
2
3.5
2
3.5
2
3.5
2
3.5
ns
3, 4, 5
Setup Times:
Address
ADSP, ADSC, ADV
Data In
Write
Chip Enable
tADKH
tADSKH
tDVKH
tWVKH
tEVKH
1.5
2
2
2
ns
Hold Times:
Address
ADSP, ADSC, ADV
Data In
Write
Chip Enable
tKHAX
tKHADSX
tKHDX
tKHWX
tKHEX
0.5
0.5
0.5
0.5
ns
NOTES:
1. Write is defined as either any SBx and SW low or SGW is low. Chip Enable is defined as SE1 low, SE2 high, and SE3 low whenever ADSP
or ADSC is asserted.
2. All read and write cycle timings are referenced from K or G.
3. This parameter is sampled and not 100% tested.
4. Measured at
± 200 mV from steady state.
5. At any given voltage and temperature, tKHQZ max is less than tKHQX1 min for a given device and from device to device.
OUTPUT
Z0 = 50 Ω
RL = 50 Ω
1.25 V
Figure 2. AC Test Load


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