Si53112-A03A

Rev. 1.0

5

Table 2. Current Consumption

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Operating Current

133 MHz, VDD Rail, Zo=85



—18

25

mA

133 MHz, VDDA + VDDR, PLL Mode,

Zo=85



—17

20

mA

133 MHz, CL = Full Load, VDD IO

Rail, Zo=85



—85

110

mA

Power Down, VDD Rail

—

0.4

1

mA

Power Down, VDDA Rail

—

2

5

mA

Power Down, VDD_IO Rail

—

0.2

0.5

mA

Table 3. Output Skew, PLL Bandwidth and Peaking

Parameter

Test Condition

Min

TYP

Max

Unit

CLK_IN, DIF[x:0]

Input-to-Output Delay in PLL Mode

Nominal Value1,2,3,4

–100

27

100

ps

CLK_IN, DIF[x:0]

Input-to-Output Delay in Bypass Mode

\Nominal Value2,4,5

2.5

3.3

4.5

ns

CLK_IN, DIF[x:0]

Input-to-Output Delay Variation in PLL mode

Over voltage and temperature2,4,5

–100

39

100

ps

CLK_IN, DIF[x:0]

Input-to-Output Delay Variation in Bypass Mode

Over voltage and temperature2,4,5

–250

3.7

250

ps

DIF[11:0]

Output-to-Output Skew across all 12 Outputs

(Common to Bypass and PLL Mode)1,2,3,4,5

0

20

50

ps

PLL Jitter Peaking

(HBW_BYPASS_LBW =0)6

—

0.4

2.0

dB

PLL Jitter Peaking

(HBW_BYPASS_LBW =1)6

—0.1

2.5

dB

PLL Bandwidth

(HBW_BYPASS_LBW =0)7

—

0.7

1.4

MHz

PLL Bandwidth

(HBW_BYPASS_LBW =1)7

—

2

4

MHz

Notes:

1.

Measured into fixed 2 pF load cap. Input-to-output skew is measured at the first output edge following the

corresponding input.

2.

Measured from differential cross-point to differential cross-point.

3.

This parameter is deterministic for a given device.

4.

Measured with scope averaging on to find mean value.

5.

All Bypass Mode Input-to-Output specs refer to the timing between an input edge and the specific output edge created

by it.

6.

Measured as maximum pass band gain. At frequencies within the loop BW, highest point of magnification is called PLL

jitter peaking.

7.

Measured at 3 db down or half power point.