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S-8426AAA-T8T1G Datasheet(PDF) 8 Page - Seiko Instruments Inc |
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S-8426AAA-T8T1G Datasheet(HTML) 8 Page - Seiko Instruments Inc |
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8 / 37 page  BATTERY BACKUP SWITCHING IC S-8426A Series Rev.2.0_02 8 Test Circuits 10 μF VRO or VOUT VIN VSS VIN ↓ V VSS RESET VIN VBAT VOUT CS 100 k Ω VIN 100 k Ω PREEND 100 k Ω VBAT To measure VDET3, apply 6 V to VIN. V V V V V Figure 5 Test Circuit 1 Figure 6 Test Circuit 2 VDS VIN VIN VSS CS RESET VBAT VOUT PREEND A A A VBAT VIN VOUT VIN VSS VBAT Measure the value after applying 6 V to VIN. V V Figure 7 Test Circuit 3 Figure 8 Test Circuit 4 VOUT VIN VSS CS F.G. VBAT VBAT Oscillo scope Oscillo scope 100 k Ω VSS A VIN VBAT VIN Figure 9 Test Circuit 5 Figure 10 Test Circuit 6 IOUT VBAT VOUT VIN VSS VBAT V Leave open and measure the value after applying 6 V to VIN. ↓ VIN VBAT VIN VIN VSS VBAT A A IBAT ISS To measure IBAT2, apply 6 V to VIN and then leave VIN open and measure IBAT. Figure 11 Test Circuit 7 Figure 12 Test Circuit 8 |
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