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S-8211DAA-M5T1U Datasheet(PDF) 11 Page - Seiko Instruments Inc |
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S-8211DAA-M5T1U Datasheet(HTML) 11 Page - Seiko Instruments Inc |
11 / 38 page BATTERY PROTECTION IC FOR 1-CELL PACK Rev.6.5_02 S-8211D Series 11 3. 3 S-8211DAN, S-8211DAQ, S-8211DAT, S-8211DAX Table 13 Item Symbol Condition Min. Typ. Max. Unit Test Condi- tion Test Circuit DELAY TIME (Ta = +25°C) Overcharge detection delay time tCU − 0.96 1.2 1.4 s 8 5 Overdischarge detection delay time tDL − 120 150 180 ms 8 5 Discharge overcurrent detection delay time tDIOV − 14.5 18 22 ms 9 5 Load short-circuiting detection delay time tSHORT − 240 300 360 μs 9 5 DELAY TIME (Ta = −40°C to +85°C)*1 Overcharge detection delay time tCU − 0.7 1.2 2.0 s 8 5 Overdischarge detection delay time tDL − 83 150 255 ms 8 5 Discharge overcurrent detection delay time tDIOV − 10 18 30 ms 9 5 Load short-circuiting detection delay time tSHORT − 150 300 540 μs 9 5 *1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by design, not tested in production. |
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