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LM45 Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part No. LM45
Description  SOT-23 Precision Centigrade Temperature Sensors
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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Absolute Maximum Ratings (Note 1)
Supply Voltage
+12V to −0.2V
Output Voltage
+V
S + 0.6V to
−1.0V
Output Current
10 mA
Storage Temperature
−65˚C to +150˚C
Lead Temperature:
SOT Package (Note 2):
Vapor Phase (60 seconds)
215˚C
Infrared (15 seconds)
220˚C
ESD Susceptibility (Note 3):
Human Body Model
Machine Model
2000V
250V
Operating Ratings (Note 1)
Specified Temperature Range
(Note 4)
T
MIN to TMAX
LM45B, LM45C
−20˚C to +100˚C
Operating Temperature Range
LM45B, LM45C
−40˚C to +125˚C
Supply Voltage Range (+V
S)
+4.0V to +10V
Electrical Characteristics
Unless otherwise noted, these specifications apply for +V
S = +5Vdc and ILOAD = +50 µA, in the circuit of Figure 2. These
specifications also apply from +2.5˚C to T
MAX in the circuit of Figure 1 for +VS = +5Vdc. Boldface limits apply for TA = T J =
T
MIN to TMAX ; all other limits TA = TJ = +25˚C, unless otherwise noted.
Parameter
Conditions
LM45B
LM45C
Units
(Limit)
Typical
Limit
Typical
Limit
(Note 5)
(Note 5)
Accuracy
T
A=+25˚C
±2.0
±3.0
˚C (max)
(Note 6)
T
A=TMAX
±3.0
±4.0
˚C (max)
T
A=TMIN
±3.0
±4.0
˚C (max)
Nonlinearity
T
MIN≤TA≤TMAX
±0.8
±0.8
˚C (max)
(Note 7)
Sensor Gain
T
MIN≤TA≤TMAX
+9.7
+9.7
mV/˚C (min)
(Average Slope)
+10.3
+10.3
mV/˚C (max)
Load Regulation (Note 8)
0
≤I
L≤ +1 mA
±35
±35
mV/mA
(max)
Line Regulation
+4.0V
≤+V
S≤+10V
±0.80
±0.80
mV/V (max)
(Note 8)
±1.2
±1.2
mV/V (max)
Quiescent Current
+4.0V
≤+V
S≤+10V, +25˚C
120
120
µA (max)
(Note 9)
+4.0V
≤+V
S≤+10V
160
160
µA (max)
Change of Quiescent
4.0V
≤+V
S≤10V
2.0
2.0
µA (max)
Current (Note 9)
Temperature Coefficient
+2.0
+2.0
µA/˚C
of Quiescent Current
Minimum Temperature
In circuit of
+2.5
+2.5
˚C (min)
for Rated Accuracy
Figure 1,I
L=0
Long Term Stability (Note 10)
T
J=TMAX, for 1000 hours
±0.12
±0.12
˚C
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions.
Note 2: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in a current National Semicon-
ductor Linear Data Book for other methods of soldering surface mount devices.
Note 3: Human body model, 100 pF discharged through a 1.5 k
Ω resistor. Machine model, 200 pF discharged directly into each pin.
Note 4: Thermal resistance of the SOT-23 package is 260˚C/W, junction to ambient when attached to a printed circuit board with 2 oz. foil as shown in
Figure 3.
Note 5: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6: Accuracy is defined as the error between the output voltage and 10 mv/˚C times the device’s case temperature, at specified conditions of voltage, current,
and temperature (expressed in ˚C).
Note 7: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature
range.
Note 8: Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be com-
puted by multiplying the internal dissipation by the thermal resistance.
Note 9: Quiescent current is measured using the circuit of
Figure 1.
Note 10: For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46
hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur.
www.national.com
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