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SSF1N90D Datasheet(PDF) 6 Page - Silikron Semiconductor Co.,LTD. |
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SSF1N90D Datasheet(HTML) 6 Page - Silikron Semiconductor Co.,LTD. |
6 / 7 page SSF1N90D ©Silikron Semiconductor CO.,LTD. 2015.1.20 Version : 1.0 page 6 of 7 www.silikron.com Ordering and Marking Information Device Marking: SSF1N90D Package (Available) TO-252(DPAK) Operating Temperature Range C : -55 to 150 ºC Devices per Unit(options) Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices High Temperature Gate Bias(HTGB) Tj=150℃@ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices Tapes/Inner Units/Inner Inner Units/Carton Box Box Boxes/Carton Box Box TO-252 2500 2 5000 7 35000 TO-252 2500 1 2500 10 25000 TO-252 800 5 4000 8 32000 Package Type Units/Tape |
Similar Part No. - SSF1N90D |
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