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NL17SZ00CMUTCG Datasheet(PDF) 2 Page - ON Semiconductor |
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NL17SZ00CMUTCG Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 9 page NL17SZ00 www.onsemi.com 2 PIN ASSIGNMENT (SOT−353/ SC70−5/SC−88A/SOT−553/ UDFN) Pin 1 2 3 4 5 Function IN A IN B GND OUT Y VCC Input FUNCTION TABLE B L H L H Output Y = AB Y H H H L A L L H H PIN ASSIGNMENT (SOT−953) Pin 1 2 3 4 5 Function IN A GND IN B OUT Y VCC MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage −0.5 to + 7.0 V VIN DC Input Voltage −0.5 to + 7.0 V VOUT DC Output Voltage (SOT−353/SC70−5/SC−88A/SOT−553/UDFN Packages) Power−Down Mode −0.5 to + 7.0 V VOUT DC Output Voltage (SOT−953 Package) −0.5 to VCC + 0.5 V IIK DC Input Diode Current −50 mA IOK DC Output Diode Current VOUT < GND, VOUT > VCC (SOT−953 Package) ±50 mA IOK DC Output Diode Current VOUT < GND (SOT−353/SC70−5/SC−88A/SOT−553 Packages) −50 mA IOUT DC Output Current ±50 mA ICC DC Supply Current per Supply Pin ±100 mA TSTG Storage Temperature Range −65 to + 150 °C TL Lead Temperature, 1 mm from Case for 10 Seconds 260 °C TJ Junction Temperature Under Bias +150 °C qJA Thermal Resistance SOT−353 (Note 1) SOT−553 350 496 °C/W PD Power Dissipation in Still Air at 85 °C SOT−353 SOT−553 186 135 mW MSL Moisture Sensitivity Level 1 FR Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in ESD ESD Classification Human Body Model (Note 2) Machine Model (Note 3) Charged Device Model (Note 4) 2000 200 N/A ILATCHUP Latchup Performance Above VCC and Below GND at 125°C (Note 5) ±100 mA Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow. 2. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B. 3. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−A. 4. Tested to JESD22−C101−A. 5. Tested to EIA/JESD78. |
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