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TS-8900 Datasheet(PDF) 6 Page - Keysight Technologies

Part No. TS-8900
Description  TS-8900 Automotive Electronics Functional Test System
Download  63 Pages
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Maker  KEYSIGHT [Keysight Technologies]
Homepage  http://www.keysight.com
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TS-8900 Datasheet(HTML) 6 Page - Keysight Technologies

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6
Figure 2. The Keysight M9216A enables significant throughput improvement via parallel voltage measurement.
TS-8900 Platform Architecture (continued)
The M9185A provides isolated 16-bit 8 / 16 channels of DC
voltage channels with support of up to 16 V, providing the
user with a direct input to the automotive DUT which for
light vehicles will normally require up to 12 V.
The M9216A provides users up to 32 voltage measurement
channels with a 10 mV – 100 V auto measurement range
in one single PXI card. This new high voltage acquisition
module enables customers to improve their voltage
measurements throughput by via new parallel test
methodology compared to the current sequential
measurement methodology using a digital multimeter
(DMM) and switch matrix. With a sampling rate of
250 kSamples/s per channel, the M9216A supports
measurement of higher frequency signals of up to 100 kHz.
New test methodology:
Parallel vs sequential voltage measurement
The M9216A empowers customers with improved
throughput via parallel voltage measurements compared
to the industry standard of sequential measurements.
With reference to Figure 2 below, the M9216A enables
significant voltage measurement improvements compared
to sequential measurements using a digital multimeter and
switch matrix configuration.
The M9182A and M9183A provides users with the highest
transactional speeds in the market at 4500 readings/s and
20,000 readings/s respectively. The M9183A also supports
advanced triggering, capacitance measurements and more
temperature functions, providing users with flexibility to
support a broad range of measurements.
Subsystem voltage measurement – Sequential vs. Parallel Measurement
3ms
6ms
12ms
15ms
18ms
21ms
24ms
9ms
– Sequential measurement
– Path needs to be switched
– Total test time displayed is based on a sample test plan and only serves as an example. Actual test times vary by application.
3ms
3ms
3ms
3ms
3ms
3ms
3ms
3ms
– Parallel measurement
– Does not require an external switch matrix or multiplexer
– Total test time displayed is based on a sample test plan and only serves as an example. Actual test times vary by application.


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