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TS-5020 Datasheet(PDF) 7 Page - Keysight Technologies

Part No. TS-5020
Description  TS-5020 Automotive Electronics Functional Test System
Download  9 Pages
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Maker  KEYSIGHT [Keysight Technologies]
Homepage  http://www.keysight.com
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TS-5020 Datasheet(HTML) 7 Page - Keysight Technologies

   
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7
Three modes
The TS-5020 enables three different
modes for performing UUT-assisted
test. The best choice of mode
depends on the test stimulus source
and response destination.
– Serial link evaluation: This mode
simply evaluates the serial link
and microcontroller. Commands
sent to the microcontroller over
the serial link prompt a response
that is sent back to the test system.
The system then verifies the
response and may perform a full
CRC memory check. Parametric
tests may also be run to test serial
link characteristics such as delay,
rise or fall time, and input impedance.
– I/O status evaluation: This mode
uses the test system I/O to
determine ECM input states. It
does this by sending a message
over the serial link to the ECM
prompting it to run a test routine.
For example, this mode may be
used to apply an analog input to
the ECM to verify A/D conversion
and the module’s handling and
communication of data over the
serial link. (For example, the
analog input may be a simulation
of a sensor’s output for air
temperature.) In this mode, the
test system can use UUT-assisted
testing to assess proper
functioning of several functions
at once, including the controller,
serial link, A/D and waveform
processing circuitry.
– Input evaluation: In this mode, the
test system supplies an input then
reads the value at either the input or
output of the module. The evaluation
can verify proper receipt of the
signal at the module input or if the
input cause the appropriate output.
Throughput multiplier
The throughput multiplier test
strategy (multiple-up UUT testing) is
one way to increase throughput for a
manufacturing environment. Multiple
UUT testing not only consolidates
tasks common to multiple modules,
such as load/unload, instrument
setup of signal and load routing,
it’s also an effective strategy for
overlapping inherent latencies in
the UUT or test system [shown in
figures 5 and 6].
Reduce total test cost
Test cost is only one factor
in reducing the total cost of
manufacturing an ECM. However, it is
the tangible cost that can be reduced
by test engineering to reduce cost
times, equipment costs and floor
space. The TS-5020 answers the call
by delivering reduced integration
costs, floor space and test times.
With the volume increase in safety,
security and convenience modules,
manufacturers are looking for ways
to meet their line-production rate
without building up inventory on the
production line. Using the throughput
multiplier for parallel multiple-up
testing of ECMs not only reduces
floor space and increases asset
utilization, it decreases test times
per ECM.
Instrumentation hardware is often
believed to be the most significant
contributor to test cost, but that
may not always be the case. Hidden
costs of software engineering time,
operating costs and maintenance
expenses must also be considered
in the cost equation. Operation costs
include management, facilities, and
the skilled personnel needed to run
the test systems. With a standard
platform of hardware and software,
support and training costs are lower
than with a unique, custom-built system.
UUT1
UUT2
UUT1
UUT2
Load
UUT Power
Setup
instrument
Load
UUT Power
Setup
instrument
Load
UUT Power
Setup
instrument
UUT
setup Delay Measure
UUT
setup Delay Measure
UUT
setup Delay Measure
Unload
UUT
Unload
UUT
Unload
UUT
Load
UUT Power
Setup
instrument
UUT
setup Delay Measure
Unload
UUT
Time
Time
Figure 5. Single-uptesting of two or more UUTs.
Figure 6. Multi-up testing of two or more UUTs.


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