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SI7904DN Datasheet(PDF) 16 Page - Analog Devices |
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SI7904DN Datasheet(HTML) 16 Page - Analog Devices |
16 / 24 page REV. C –16– ADN8830 The gate drive outputs for the PWM amplifier at P1 (Pin 21) and N1 (Pin 22) have a typical nonoverlap delay of 65 ns. This is done to ensure that one FET is completely off before the other FET is turned on, preventing current from shooting through both simultaneously. The input capacitance (CISS) of the FET should not exceed 5 nF. The P1 and N1 outputs from the ADN8830 have a typical output impedance of 6 Ω. This creates a time constant in combination with CISS of the external FETs equal to 6 Ω CISS. To ensure shoot-through does not occur through these FETs, this time constant should remain less than 30 ns. The linear output from the ADN8830 uses N2 (Pin 10) and P2 (Pin 11) to drive the gates of the linear side FETs, shown as Q3 and Q4 in Figure 1. Local compensation for the linear ampli- fier is achieved through the gate-to-drain capacitances (CGD) of Q3 and Q4. The value of CGD, which can be determined from the data sheet, is usually referred to as CRSS, the reverse transfer capacitance. The exact CRSS value should be determined from a graph that shows capacitance versus drain-to-source voltage, using the power supply voltage as the appropriate VDS. To ensure stability of the linear amplifier, the total CGD of the PMOS device, Q3, should be greater than 2.5 nF and the total CGD of the NMOS should be greater than 150 pF. External capacitance can be added around the FET to increase the effective CGD of the transistor. This is the function of C6 in the typical application schematic shown in Figure 1. If external capacitance must be added, it will generally only be required around the PMOS transistor. In the event of zero output current through the TEC, there will be no current flowing through Q3 and Q4. In this condition, these FETs will not provide any small signal gain and thus no negative feedback for the linear amplifier. This leaves only a feedforward signal path through CGD, which could cause a settling problem at OUT B. This is often seen as a small signal oscillation at OUT B, but only when the TEC is at or very near zero current. The remedy for this potential minor instability is to add capacitance from OUT B to ground. This may need to be deter- mined empirically, but a good starting point is 1.5 times the total CGD. This is the function of C12 in Figure 1. Note that while adding more CGD around Q3 and Q4 will help to ensure stability, it could potentially increase instability in the zero current dead band region, requiring additional capacitance from OUT B to ground. Bear in mind that the addition of these capacitors is only for local stabilization. The stability of the entire TEC appli- cation may need adjustment, which should be done around the compensation amplifier. This is covered in the Compensation Loop section. There is one additional consideration for selecting both the linear output FETs; they must have a minimum threshold voltage (VT) of 0.6 V. Lower threshold voltages could cause shoot-through current in the linear output transistors. Table V shows the recommended FETs that can be used for the linear output in the ADN8830 application. Table V includes the appropriate external gate-to-drain capacitance (external CGD) and snubber capacitor value (CSNUB) connected from OUT B to ground that should be added to ensure local stability. Table VI shows the recommended PWM output FETs. Although other transistors can be used, these combinations have been tested and are proved stable and reliable for typical applications. Data sheets for these devices can be found at their respective websites: Fairchild – www.fairchildsemi.com Vishay Siliconix – www.vishay.com International Rectifier – www.irf.com Calculating Power Dissipation and Efficiency The total efficiency of the ADN8830 application circuit is simply the ratio of the output power to the TEC divided by the total power delivered from the supply. The idea in minimizing power dissipation is to avoid both drawing additional power and reduc- ing heat generated from the circuit. The dominant sources of power dissipation will include resistive losses, gate charge loss, core loss from the inductor, and the current used by the ADN8830 itself. The on-channel resistance of both the linear and PWM output FETs will affect efficiency primarily at high output currents. Because the linear amplifier operates in a high gain configuration, it will be at either ground or VDD when significant current is flowing through the TEC. In this condition, the power dissipation through the linear output FET will be Pr I FET LIN DS ON TEC ,, =× 2 (34) using either the rDS, ON for the NMOS or the PMOS depending on the direction of the current flow. In the typical application setup in Figure 2, if the TEC is cooling the target object, the PMOS is sourcing the current. If the TEC is heating the object, the NMOS will be sinking current. Table IV. Partial List of Capacitors and Key Specifications Value ( F) ESR (m )Voltage Rating (V) Part Number Manufacturer Website 10 60 6.3 NSP100M6.3D2TR NIC Components www.niccomp.com 22 * 35 8 ESRD220M08B Cornell Dubilier www.cornell-dubilier.com 22 35 8 NSP220M8D5TR NIC Components www.niccomp.com 22 35 8 EEFFD0K220R Panasonic www.maco.panasonic.co.jp 47 25 6.3 NSP470M6.3D2TR NIC Components www.niccomp.com 68 18 8 ESRD680M08B Cornell Dubilier www.cornell-dubilier.com 100 95 10 594D107X_010C2T Vishay www.vishay.com *Recommend capacitor in typical application circuit Figure 1. |
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