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NB6L72 Datasheet(PDF) 6 Page - ON Semiconductor |
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NB6L72 Datasheet(HTML) 6 Page - ON Semiconductor |
6 / 11 page ![]() NB6L72 http://onsemi.com 6 Table 6. AC CHARACTERISTICS VCC = 2.375 V to 3.63 V, VEE = 0 V, or VCC = 0 V, VEE = -2.375 V to -3.63 V, TA = -40°C to +85°C; (Note 10) Symbol Characteristic Min Typ Max Unit VOUTPP Output Voltage Amplitude (@ VINPPmin)fin ≤ 1.5 GHz (Note 14) (See Figure 16) fin ≤ 2.5 GHz fin ≤ 3.0 GHz 520 380 320 800 650 500 mV tPLH, tPHL Propagation Delay (@0.5GHz) Dn to Qn SELn to Qn 325 425 525 ps tSKEW Duty Cycle Skew (Note 11) Within Device Skew Device to Device Skew (Note 12) 5 20 20 80 ps tDC Output Clock Duty Cycle fin ≤ 3.0 GHz (Reference Duty Cycle = 50%) 40 50 60 % tJITTER RMS Random Clock Jitter (Note 13) fin = 2.5 GHz fin = 3.0 GHz Data Dependent Jitter fDATA = 2.5 Gb/s fDATA = 3.0 Gb/s 0.2 0.3 12 15 0.5 1 ps VINPP Input Voltage Swing/Sensitivity (Differential Configuration) (Note 14) 150 VCC - GND mV tr,tf Output Rise/Fall Times @ 0.5 GHz (20% - 80%) Q, Q 100 160 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 10. Measured by forcing VINPP (minimum) from a 50% duty cycle clock source. All loading with an external RL = 50 W to VCC – 2.0 V. Input edge rates 40 ps (20% - 80%). 11. Duty cycle skew is measured between differential outputs using the deviations of the sum of Tpw- and Tpw+ @ 0.5 GHz. 12. Device to device skew is measured between outputs under identical transition @ 0.5 GHz. 13. Additive RMS jitter with 50% duty cycle clock signal. 14. Input and output voltage swing is a single-ended measurement operating in differential mode. |
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