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SCANPSC100FSC Datasheet(PDF) 1 Page - Fairchild Semiconductor |
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SCANPSC100FSC Datasheet(HTML) 1 Page - Fairchild Semiconductor |
1 / 21 page © 2000 Fairchild Semiconductor Corporation DS010968 www.fairchildsemi.com December 1991 Revised May 2000 SCANPSC100F Embedded Boundary Scan Controller (IEEE 1149.1 Support) General Description The SCANPSC100F is designed to interface a generic par- allel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is associated with applying serial patterns with a paral- lel processor. The SCANPSC100F operates by serializing data from the parallel bus for shifting through the chain of 1149.1 compliant components (i.e., scan chain). Scan data returning from the scan chain is placed on the parallel port to be read by the host processor. Up to two scan chains can be directly controlled with the SCANPSC100F via two independent TMS pins. Scan control is supplied with user specific patterns which makes the SCANPSC100F proto- col-independent. Overflow and underflow conditions are prevented by stopping the test clock. A 32-bit counter is used to program the number of TCK cycles required to complete a scan operation within the boundary scan chain or to complete a SCANPSC100F Built-In Self Test (BIST) operation. SCANPSC100F device drivers and 1149.1 embedded test application code are available with Fair- child’s SCAN Ease software tools. Features s Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture s Supported by Fairchild’s SCAN Ease (Embedded Appli- cation Software Enabler) Software s Uses generic, asynchronous processor interface; com- patible with a wide range of processors and PCLK fre- quencies s Directly supports up to two 1149.1 scan chains s 16-bit Serial Signature Compaction (SSC) at the Test Data In (TDI) port s Automatically produces pseudo-random patterns at the Test Data Out (TDO) port s Fabricated on FACT 1.5 µm CMOS process s Supports 1149.1 test clock (TCK) frequencies up to 25 MHz s TTL-compatible inputs; full-swing CMOS outputs with 24 mA source/sink capability Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram FACT is a trademark of Fairchild Semiconductor Corporation. Order Number Package Number Package Description SCANPSC100FSC M28B 28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide |
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