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SCAN16512SM Datasheet(PDF) 3 Page - National Semiconductor (TI) |
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SCAN16512SM Datasheet(HTML) 3 Page - National Semiconductor (TI) |
3 / 10 page Connection Diagram 20026603 Top View See NS Package Number SLC64A Truth Table Function Table (Note 1) Inputs Outputs OEAB LEAB CLKAB A B LL L X B 0 (Note 2) LL ↑ LL LL ↑ HH LH X L L LH X H H H XXX Z H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial (HIGH or LOW, inputs may not float) Z = High Impedance Note 1: A-to-B data flow is shown. B-to-A data flow is similar, but uses OEBA, LEBA, and CLKBA. Note 2: Output level before the indicated steady-state input conditions were established. Functional Description In the normal mode, these devices are 16-bit universal bus transceivers that combine D-type latches and D-type flip- flops to allow data flow in transparent, latched, or clocked modes. They can be used as two 8-bit transceivers, or as one 16-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP may affect the normal functional operation of the universal bus transceivers. When the TAP is activated, the test circuitry performs boundary-scan test op- erations according to the protocol described in IEEE Std 1149.1-1990. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB is LOW, the B outputs are active. When OEAB is HIGH, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs. Five dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), test clock (TCK), and test reset (TRST). All testing and scan operations are syn- chronized to the TAP interface. For details about the sequence of boundary scan cells in the SCAN16512, please refer to the BSDL (Boundary Scan Description Language) file available on our website. www.national.com 3 |
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