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TLV5638MDREP Datasheet(PDF) 6 Page - Texas Instruments

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Part No. TLV5638MDREP
Description  2.7-V TO 5.5V LOW-POWER DUAL 12 BIT DIGITAL-TO-ANALOG CONVERTER WITH INTERNAL REFERENCE AND POWER DOWN
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Maker  TI1 [Texas Instruments]
Homepage  http://www.ti.com
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TLV5638MDREP Datasheet(HTML) 6 Page - Texas Instruments

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TLV5638EP
2.7V TO 5.5V LOW POWER DUAL 12BIT DIGITALTOANALOG
CONVERTER WITH INTERNAL REFERENCE AND POWER DOWN
SGLS130B − JULY 2002 − REVISED DECEMBER 2003
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions (unless otherwise noted)
(continued)
analog output dynamic performance
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ts(FS)
Output settling time, full scale
RL = 10 kΩ,CL = 100 pF,
Fast
1
3
s
ts(FS)
Output settling time, full scale
RL = 10 kΩ,CL = 100 pF,
See Note 11
Slow
3.5
7
µs
ts(CC)
Output settling time, code to code
RL = 10 kΩ,CL = 100 pF,
Fast
0.5
1.5
s
ts(CC)
Output settling time, code to code
RL = 10 kΩ,CL = 100 pF,
See Note 12
Slow
1
2
µs
SR
Slew rate
RL = 10 kΩ,CL = 100 pF,
Fast
12
V/ s
SR
Slew rate
RL = 10 kΩ,CL = 100 pF,
See Note 13
Slow
1.8
V/
µs
Glitch energy
DIN = 0 to 1,
FCLK = 100 kHz,
CS = VDD
5
nV−s
SNR
Signal-to-noise ratio
69
74
S/(N+D)
Signal-to-noise + distortion
fs = 480 kSPS, fout = 1 kHz,
58
67
dB
THD
Total harmonic distortion
fs = 480 kSPS, fout = 1 kHz,
RL = 10 kΩ,CL = 100 pF
−69
−57
dB
Spurious free dynamic range
RL = 10 k ,CL = 100 pF
57
72
NOTES: 12. Settling time is the time for the output signal to remain within
±0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFDF and 0xFDF to 0x020 respectively. Not tested, assured by design.
13. Settling time is the time for the output signal to remain within
± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
14. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
digital input timing requirements
MIN
NOM
MAX
UNIT
tsu(CS−CK)
Setup time, CS low before first negative SCLK edge
10
ns
tsu(C16-CS)
Setup time, 16th negative SCLK edge (when D0 is sampled) before CS rising edge
10
ns
twH
SCLK pulse width high
25
ns
twL
SCLK pulse width low
25
ns
tsu(D)
Setup time, data ready before SCLK falling edge
10
ns
th(D)
Hold time, data held valid after SCLK falling edge
5
ns


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